Bloch state constrained by spatial and time-reversal symmetries von Okamura, Koshi

Volltext

Spin-dependent electron–radiation interaction von Okamura, Koshi

Volltext

Appropriate choice of channel ratio in thin-film transistors for the exact determination of field-effect mobility von Okamura, Koshi, Nikolova, Donna, Mechau, Norman, Hahn, Horst

Volltext

Focus on the overlap density of wavefunctions in GW approximations von Okamura, Koshi

Volltext

Influence of interface roughness on the performance of nanoparticulate zinc oxide field-effect transistors von Okamura, Koshi, Mechau, Norman, Nikolova, Donna, Hahn, Horst

Volltext

Metal-semiconductor hybrid thin films in field-effect transistors von Okamura, Koshi, Dehm, Simone, Hahn, Horst

Volltext

Vertical electrical conduction in pentacene polycrystalline thin films mediated by Au-induced gap states at grain boundaries von Sawabe, Tomoaki, Okamura, Koshi, Sueyoshi, Tomoki, Miyamoto, Takashi, Kudo, Kazuhiro, Ueno, Nobuo, Nakamura, Masakazu

Volltext

Carrier transport in nanocrystalline field-effect transistors: Impact of interface roughness and geometrical carrier trap von Okamura, Koshi, Hahn, Horst

Volltext

Infrared spectroscopy of pentacene thin film on SiO2 surface von HOSOI, Yoshinobu, OKAMURA, Koshi, KIMURA, Yasuo, ISHII, Hisao, NIWANO, Michio

Volltext

Potential distribution in channel of thin-film transistors von Okamura, Koshi, Hahn, Horst

Volltext

Vertical electrical conduction in pentacene polycrystalline thin films mediated by Au-induced gap states at grain boundaries von Sawabe, Tomoaki, Okamura, Koshi, Sueyoshi, Tomoki, Miyamoto, Takashi, Kudo, Kazuhiro, Ueno, Nobuo, Nakamura, Masakazu

Volltext

Carrier transport in nanocrystalline field-effect transistors: Impactof interface roughness and geometrical carrier trap von Okamura, Koshi, Hahn, Horst

Volltext

Solution-processed oxide semiconductor SnO in p-channel thin-film transistors von Okamura, Koshi, Nasr, Babak, Brand, Richard A., Hahn, Horst

Volltext

Infrared spectroscopy of pentacene thin film on SiO 2 surface von Hosoi, Yoshinobu, Okamura, Koshi, Kimura, Yasuo, Ishii, Hisao, Niwano, Michio

Volltext

Application of capacitance-voltage measurements to the determination of interface roughness in nanoparticulate field-effect transistors von Okamura, Koshi, Nikolova, Donna, Mechau, Norman, Hahn, Horst

Volltext

Polymer stabilized ZnO nanoparticles for low-temperature and solution-processed field-effect transistors von Okamura, Koshi, Nikolova, Donna, Mechau, Norman, Hahn, Horst

Volltext

Adsorption of naphthalene on a Si(1 0 0)-2 × 1 surface investigated by infrared spectroscopy von Okamura, Koshi, Ishii, Hisao, Kimura, Yasuo, Niwano, Michio

Volltext

Vertical electrical conduction in pentacene polycrystalline thin films mediated by Au-induced gap states at grain boundaries: Organic Materials for Electronic Applications von SAWABE, Tomoaki, OKAMURA, Koshi, SUEYOSHI, Tomoki, MIYAMOTO, Takashi, KUDO, Kazuhiro, UENO, Nobuo, NAKAMURA, Masakazu

Volltext

Solution-processed oxide semiconductor SnO in p-channel thin-film transistorsElectronic supplementary information (ESI) available: Experimental details, SEM and AFM images of the t... von Okamura, Koshi, Nasr, Babak, Brand, Richard A, Hahn, Horst

Volltext

Polymer stabilized ZnO nanoparticles for low-temperature and solution-processed field-effect transistorsElectronic supplementary information (ESI) available: The infrared absorptio... von Okamura, Koshi, Nikolova, Donna, Mechau, Norman, Hahn, Horst

Volltext