Matrix-Enhanced Secondary Ion Mass Spectrometry:  A Method for Molecular Analysis of Solid Surfaces von Wu, Kuang Jen, Odom, Robert W

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Mutational Analysis of Photosystem I Polypeptides in the Cyanobacterium Synechocystis sp. PCC 6803. TARGETED INACTIVATION OF psaI REVEALS THE FUNCTION OF PsaI IN THE STRUCTURAL ORG... von Xu, Qiang, Hoppe, Dan, Chitnis, Vaishali P., Odom, William R., Guikema, James A., Chitnis, Parag R.

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Characterizing synthetic polymers by MALDI MS von Wu, K J, Odom, R W

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Interaction of CPa-1 with the manganese-stabilizing protein of photosystem II: identification of domains cross-linked by 1-ethyl-3-[3-dimethylamino)propyl]carbodiimide von Odom, William R, Bricker, Terry M

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Nature of the pulsed laser process for the deposition of high Tc superconducting thin films von VENKATESAN, T, WU, X. D, MAGEE, C. A, INAM, A, JEON, Y, CROFT, M, CHASE, E. W, CHANG, C. C, WACHTMAN, J. B, ODOM, R. W, RADICATI DI BROZOLO, F

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XPS and TOF-SIMS Microanalysis of a Peptide/Polymer Drug Delivery Device von John, C. M, Odom, R. W, Salvati, L, Annapragada, A, Lu, M. Y. Fu

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Close association of the 33 kDa extrinsic protein with the apoprotein of CPa1 in photosystem II von Bricker, Terry M., Odom, William R., Queirolo, Carlos B.

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Surface Analysis by Highly Charged Ion Based Secondary Ion Mass Spectrometry von Schenkel, T, Hamza, A V, Barnes, A V, Newman, M W, Machicoane, G, Niedermayer, T, Hattass, M, McDonald, J W, Schneider, D H, Wu, K J, Odom, R W

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Analysis of surface particles by time-of-flight secondary ion mass spectrometry von Chu, P.K., Odom, R.W., Reich, D.F.

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Characterization of Synechocystis sp. PCC 6803 in iron-supplied and iron-deficient media von Odom, W.R, Hodges, R, Chitnis, P.R, Guikema, J.A

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Thin film microanalysis using laser ablation and laser ionization mass spectrometry von Odom, R.W., Schueler, B.

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Diffusion and gettering of implanted ions in YBCO films von Hong, S.H., Chan, M.L., Baniecki, J., Ma, Q.Y., Wang, H.A., Odom, R.W., LaGraff, J., Murduck, J., Chan, H.

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Characterizing synthetic von KUANG JEN WU, ODOM, R. W

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Static secondary ion mass spectrometry (SSIMS) of biological compounds in tissue and tissue-like matrices von John, C.M., Odom, R.W.

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Quantitative trace element analysis of microdroplet residues by secondary-ion mass spectrometry von Odom, Robert W, Lux, Gayle, Fleming, Ronald H, Chu, Paul K, Niemeyer, Ilsabe C, Blattner, Richard J

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Microvolume-secondary ion mass spectrometry analysis of nonvolatile sulfur residues in semiconductor process solutions von CHIA, V. K. F, BLEILER, R. J, SAMS, D. B, CRAIG, A. Y, ODOM, R. W

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Targeted deletion of psaJ from the cyanobacterium Synechocystis sp. PCC 6803 indicates structural interactions between the PsaJ and PsaF subunits of photosystem I von Xu, Q, Odom, W.R, Guikema, J.A, Chitnis, V.P, Chitnis, P.R

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Low-background instrumental neutron activation analysis of silicon semiconductor materials von SMITH, A. R, MCDONALD, R. J, MANINI, H, HURLEY, D. L, NORMAN, E. B, VELLA, M. C

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A rule-building expert system for classification of mass spectra von Harrington, Peter de B, Street, Thomas E, Voorhees, Kent J, Radicati di Brozolo, Filippo, Odom, Robert W

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Nonresonant multiphoton ionization of the neutrals ablated in laser microprobe mass spectrometry analysis of GaAs and Hg0.78Cd0.22Te von SCHUELER, B, ODOM, R. W

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