Raman spectroscopic assessment of degree of conversion of bulk-fill resin composites--changes at 24 hours post cure von Par, M, Gamulin, O, Marovic, D, Klaric, E, Tarle, Z

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Infrared spectroscopy of ion tracks in amorphous SiO2 and comparison to gamma irradiation induced changes von Karlušić, M., Škrabić, M., Majer, M., Buljan, M., Skuratov, V.A., Jung, H.K., O. Gamulin, Jakšić, M.

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106 Attenuated Total Reflectance – Fourier Transform Infrared Spectroscopy (ATR-FTIR) Reveals Increased Cholesterol Esters in Drug Resistant Laryngeal Carcinoma Cells von Osmak, M, Rak, S, DeZan, T, Gamulin, O, Kovosic, M

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Monitoring the healing process of rat bones using Raman spectroscopy von Gamulin, O., Serec, K., Bilić, V., Balarin, M., Kosović, M., Drmić, D., Brčić, L., Seiwerth, S., Sikirić, P.

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Monitoring structural phase transition of (Ge 2S 3) x (As 2S 3) 1− x chalcogenide glass with Raman spectroscopy von Gamulin, O, Ivanda, M, Mitsa, V, Balarin, M, Kosović, M

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The effect of excitation laser power in Raman spectroscopic measurements of the degree of conversion of resin composites von Par, Matej, Gamulin, Ozren, Spanovic, Nika, Bjelovucic, Ruza, Tarle, Zrinka

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Investigation of Spermatozoa and Seminal Plasma by Fourier Transform Infrared Spectroscopy von Barčot, O., Balarin, M., Gamulin, O., Ježek, D., Romac, P., Brnjas-Kraljević, J.

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Surface characterization of thin silicon-rich oxide films von Ristić, D., Holý, V., Ivanda, M., Marciuš, M., Buljan, M., Gamulin, O., Furić, K., Ristić, M., Musić, S., Mazzola, M., Chiasera, A., Ferrari, M., Righini, G.C.

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Optical properties of porous silicon on an insulator layer von Balarin, M., Gamulin, O., Ivanda, M., Kosović, M., Ristić, D., Ristić, M., Musić, S., Furić, K., Krilov, D.

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Structure and optical properties of porous silicon prepared on thin epitaxial silicon layer on silicon substrates von Balarin, M., Gamulin, O., Ivanda, M., Djerek, V., Celan, O., Music, S., Ristic, M., Furic, K.

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Infrared spectroscopy of ion tracks in amorphous SiO^sub 2^ and comparison to gamma irradiation induced changes von Karlušić, M, Škrabić, M, Majer, M, Buljan, M, Skuratov, VA, Jung, HK, Gamulin, O, Jakšić, M

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The effects of crystal size on the Raman spectra of nanophase TiO2 von Ivanda, M., Musić, S., Gotić, M., Turković, A., Tonejc, A.M., Gamulin, O.

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Experimental determination of absolute-scale compton cross sections using the K X-ray escape and a comparison with three versions of the impulse approximation von Pašić, S., Uroić, M., Tocilj, Z., Majer, M., Gamulin, O., Bokulić, T., Ilakovac, K.

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Monitoring structural phase transition of (Ge sub(2S) sub(3)) sub(x(As) sub(2)S sub(3)) sub(1)- sub(x chalcogenide glass with Raman spectroscopy) von Gamulin, O, Ivanda, M, Mitsa, V, Balarin, M, Kosovic, M

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Formation of CdS nanocrystals in SiO2 by ion implantation von Desnica, U.V., Desnica-Frankovic, I.D., Gamulin, O., White, C.W., Sonder, E., Zuhr, R.A.

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Generation of an ordered Ge quantum dot array in an amorphous silica matrix by ion beam irradiation: Modeling and structural characterization von Buljan, M., Bogdanović-Radović, I., Karlušić, M., Desnica, U. V., Radić, N., Skukan, N., Dražić, G., Ivanda, M., Gamulin, O., Matej, Z., Valeš, V., Grenzer, J., Cornelius, T. W., Metzger, H. T., Holý, V.

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UV–visible reflectivity study of the synthesis and growth of nanocrystals obtained by ion implantation von Desnica, U.V, Desnica-Frankovic, I.D, Gamulin, O, White, C.W, Sonder, E, Zuhr, R.A

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Structural, optical and electrical characterization of porous silicon prepared on thin silicon epitaxial layer von Balarin, M., Gamulin, O., Ivanda, M., Kosović, M., Ristić, D., Ristić, M., Musić, S., Furić, K., Krilov, D., Brnjas-Kraljević, J.

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Silicon nanocrystals by thermal annealing of Si-rich silicon oxide prepared by the LPCVD method von Ivanda, M., Gebavi, H., Ristić, D., Furić, K., Musić, S., Ristić, M., Žonja, S., Biljanović, P., Gamulin, O., Balarin, M., Montagna, M., Ferarri, M., Righini, G.C.

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cw laser crystallization of amorphous silicon : thermal or athermal process von IVANDA, M, FURIC, K, GAMULIN, O, PERSLIN, M, GRACIN, D

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