Estimation of fixed charge densities in hafnium-silicate gate dielectrics von Kaushik, V.S., O'Sullivan, B.J., Pourtois, G., Van Hoornick, N., Delabie, A., Van Elshocht, S., Deweerd, W., Schram, T., Pantisano, L., Rohr, E., Ragnarsson, L.-A., De Gendt, S., Heyns, M.

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Nanocrystalline TiO2 films studied by optical, XRD and FTIR spectroscopy von Zhang, Jun-Ying, Boyd, Ian W., O'Sullivan, B.J., Hurley, P.K., Kelly, P.V., Sénateur, J.-P.

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Deep electron traps in HfO2-based ferroelectrics: (Al/Si-doped) HfO2 versus HfZrO4 von Izmailov, R.A, O'Sullivan, B.J, Popovici, M.I, Afanas'ev, V.V

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Electron trapping in ferroelectric HfZrO4 and Al- and Si-doped layers von Izmailov, R.A, O'Sullivan, B.J, Popovici, M, Afanas'ev, V.V

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Shallow electron traps in high-k insulating oxides von Izmailov, R.A, O'Sullivan, B.J, Popovici, M, Kittl, J.A, Afanas'ev, V.V

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Interface of ultrathin HfO2 films deposited by UV-photo-CVD von Fang, Q., Zhang, J.-Y., Wang, Z., Modreanu, M., O'Sullivan, B.J., Hurley, P.K., Leedham, T.L., Hywel, D., Audier, M.A., Jimenez, C., Senateur, J.-P., Boyd, Ian W

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Deep electron traps in HfO2-based ferroelectrics: (Al/Si-doped) HfO2 versus HfZrO4 von Izmailov, R.A., O'Sullivan, B.J., Popovici, M.I., Afanas'ev, V.V.

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Electron trapping in ferroelectric HfZrO4 and Al- and Si-doped layers von Izmailov, R.A., O'Sullivan, B.J., Popovici, M., Afanas'ev, V.V.

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Effectiveness of Nitridation of Hafnium Silicate Dielectrics: A Comparison Between Thermal and Plasma Nitridation von O'Sullivan, B.J., Kaushik, V.S., Everaert, J.-L., Trojman, L., Ragnarsson, L.-A., Pantisano, L., Rohr, E., DeGendt, S., Heyns, M.

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Work-Function Engineering for 32-nm-Node pMOS Devices: High-Performance TaCNO-Gated Films von O'Sullivan, B.J., Mitsuhashi, R., Ito, S., Oikawa, K., Kubicek, S., Paraschiv, V., Adelmann, C., Veloso, A., HongYu Yu, Schram, T., Biesemans, S., Nakabayashi, T., Ikeda, A., Niwa, M.

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Shallow electron traps in high-k insulating oxides von Izmailov, R.A., O'Sullivan, B.J., Popovici, M., Kittl, J.A., Afanas'ev, V.V.

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Investigation of Imprint in FE-HfO2 and Its Recovery von Higashi, Y, Kaczer, B, Verhulst, A.S, O'Sullivan, B.J, Ronchi, N, McMitchell, S.R.C, Banerjee, K, Di Piazza, L, Suzuki, M, Linten, D, Van Houdt, J

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When should we test for voltage-gated potassium channel complex antibodies? A retrospective case control study von O’Sullivan, B.J, Steele, T, Ellul, M.A, Kirby, E, Duale, A, Kier, G, Crooks, D, Jacob, A, Solomon, T, Michael, B.D

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Impact of Charge Trapping and Depolarization on Data Retention Using Simultaneous P-V and I-V in HfO2-Based Ferroelectric FET von Higashi, Y, Ronchi, N, Kaczer, B, Alam, Md Nur K, O'Sullivan, B.J, Banerjee, K, McMitchell, S.R.C, Breuil, L, Walke, A, Van den Bosch, G, Linten, D, Van Houdt, J

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Accurate Gate Impedance Determination on Ultraleaky MOSFETs by Fitting to a Three-Lumped-Parameter Model atFrequencies From DC to RF von San Andres, E., Pantisano, L., Ramos, J., Roussel, P.J., O'Sullivan, B.J., Toledano-Luque, M., DeGendt, S., Groeseneken, G.

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(507) - Accumulation of Intragraft CD15s+Tregs in Long-term Lung Transplant Survivors von O'Sullivan, B.J., Hopkins, P., Trotter, M., Fiene, A., Tan, M., Sinclair, K., Chambers, D.

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(79) - Lysophosphatidic Acid Drives Recruitment and Fibroblastic Differentiation of Mesenchymal Stromal Cells in Chronic Lung Allograft Dysfunction von Sinclair, K.A., Tan, M.E., Sladden, T.M., Hopkins, P.M., O'Sullivan, B.J., Chambers, D.C.

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Process simplification for 15.6×15.6 cm2 interdigitated back contact silicon solar cells by laser doping von Zieliński, B., O'Sullivan, B.J., Singh, S., Urueña de Castro, A., Li, Y., Jambaldinni, S., Debucquoy, M., Mertens, R., Poortmans, J.

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Streptococcus pneumoniae infection suppresses allergic airways disease by inducing regulatory T-cells von PRESTON, J. A, THORBURN, A. N, FOSTER, P. S, HANSBRO, P. M, STARKEY, M. R, BECKETT, E. L, HORVAT, J. C, WADE, M. A, O'SULLIVAN, B. J, THOMAS, R, BEAGLEY, K. W, GIBSON, P. G

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Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics von O'Sullivan, B.J, Truijen, B, Putcha, V, Grill, A, Chasin, A, Van Den Bosch, G, Kaczer, B, Alam, M.N.K, Van Houdt, J

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