Effect of hot carrier stress on device junctions measured by electron holography and scanning capacitance microscopy von Nxumalo, J., Ioannou, D. P., Katnani, A., Brown, J., Bandy, K., Macdonald, M., Krishnasamy, R., Bruley, J.

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Optical Modulator P/N Junction Mapping by Electron Holography and Scanning Capacitance Microscopy von Wang, Y. Y., Nxumalo, J., Jeon, J., Barton, K., Nummy, K.

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2D Junction Profiling on Semiconductor Device Reliability Fail von Wang, Y.Y., Nxumalo, J., Katnani, A., Ioannou, D., Brown, J., Bandy, K., Macdonald, M., Bruley, J.

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Dysphagia lusoria--report of 2 cases and a review of the literature von Ntlhe, L M, Koto, Z, Mokotedi, S D, Nxumalo, J

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Afrique du Sud

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Quantitative two-dimensional carrier profiling of a 400 nm complementary metal–oxide–semiconductor device by Schottky scanning capacitance microscopy von Tran, T., Nxumalo, J. N., Li, Y., Thomson, D. J., Bridges, G. E., Oliver, D. R.

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High-resolution cross-sectional imaging of MOSFETs by scanning resistance microscopy von Nxumalo, J.N., Shimizu, D.T., Thomson, D.J., Simard-Normadin, M.

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Use of the focused ion beam to locate failure sites within electrically erasable read only memory microcircuits von Haythornthwaite, Ray, Nxumalo, Jochonia, Phaneuf, Michael W.

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Evaluation of emitter profiles and lateral uniformity on crystalline silicon photovoltaic cells using scanning capacitance microscopy von Kosbar, L, Nxumalo, J, Nalaskowski, J, Hupka, L, Molella, C, Liu, J, Totir, G, Fisher, K, Cotte, J, Hopstaken, M

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Dysphagia lusoria - report of 2 cases and a review of the literature : case report von Koto, Z., Ntlhe, L.M., Mokotedi, S.D., Nxumalo, J.

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Wazithovo ala izono Jesu von S.D. Church Choir

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Comment on "Masses of stable xenon isotopes: Check for internal consistency via ion cyclotron resonance mass spectrometry" von Hykawy, JG, Barber, RC, Sharma, KS, Aarts, KJ, Nxumalo, JN, Duckworth, HE

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Dual Lens Electron Holography, Scanning Capacitance Microscopy (SCM), Scanning Spreading Resistance Microscopy (SSRM) Comparison for Semiconductor 2-D Junction Characterization von Wang, Y.Y., Nxumalo, J., Zhao, W., Bandy, K., Nummy, K.

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Sensitivity of indocyanine green (ICG) half-life changes relative to circulatory shock state von Nxumalo, Joseph L., Teranaka, Masaaki, Schenk, Worthington G.

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Leakage issues in failure analysis of p+ SiGe active area short monitor von Arya, Ankur, Johnson, G. M., Ronsheim, P., Nxumalo, J., Molella, C. M., Murphy, R. J., Seung Chul Lee, Daleo, C., Bum Ki Moon, Onoda, H., Chung Woh Lai, Shenzhi Yang, Chow, Yew Tuck Clament, Lee, James

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2D carrier mapping in Si/sub 1-x/Ge/sub x/ source/drain regions of PMOSFETs used in a production device by scanning capacitance microscopy von Nxumalo, J., Wintgens, C., Haythornthwaite, R., Ho, V.

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Precise determination of the mass difference − 76 76 Se and a derived upper limit on the mass for the electron neutrino von Hykawy, J. G., Nxumalo, J. N., Unger, P. P., Lander, C. A., Barber, R. C., Sharma, K. S., Peters, R. D., Duckworth, H. E.

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Hepatic blood flow measurement III. Total hepatic blood flow measured by ICG clearance and electromagnetic flowmeters in a canine septic shock model von Nxumalo, J L, Teranaka, M, Schenk, Jr, W G

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Identifying biologically meaningful hot-weather events using threshold temperatures that affect life-history von Cunningham, Susan J, Kruger, Andries C, Nxumalo, Mthobisi P, Hockey, Philip A R

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Nitrogen Doped Carbon Nanotubes from Organometallic Compounds: A Review von Nxumalo, Edward N., Coville, Neil J.

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