Generalized transfer-fields and Langevin forces for hot-carrier fluctuations in semiconductor submicron devices von Starikov, E, Shiktorov, P, Gružinskis, V, Reggiani, L, Varani, L, Vaissière, J.C, Nougier, J.P, González, T, Mateos, J, Pardo, D

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Thermal conductivity of nonequilibrium carriers von Varani, L, Gaubert, P, Vaissière, J.C, Nougier, J.P, Mateos, J, González, T, Pardo, D, Reggiani, L, Starikov, E, Shiktorov, P, Gruzhinskis, V

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A Novel Hydrodynamic Modeling of Noise Spectra under Constant Voltage Operation von Varani, L., Starikov, E., Vaissière, J.C., Reggiani, L., Gružinskis, Viktor, Shiktorov, P., Nougier, J.P.

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Preface von Nougier, J.P.

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Hydrodynamic Modeling of Spatial Cross-Correlation of Conduction Current Fluctuations von Varani, L., Starikov, E., Pardo, D., Vaissière, J.C., González, T., Mateos, J., Reggiani, L., Gružinskis, Viktor, Shiktorov, P., Nougier, J.P.

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Transport parameters of hot electrons in GaAs at 300 K von Gasquet, D., de Murcia, M., Nougier, J.P., Gontrand, C.

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Transverse diffusion coefficient and carrier density fluctuation derived from the fluctuation of the state occupancy function in semiconductors von Nougier, J.P., Vaissiere, J.C.

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Effect of the degeneracy on the transport of hot holes in silicon von Moatadid, A., Vaissiere, J.C., Nougier, J.P.

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2-D Modeling of Electronic Noise in Semiconductor Devices von Houlet, P., Bonani, F., Ghione, G., Varani, L., Aboubacar, M., Vaissiere, J.C., Nougier, J.P., Starikov, E., Gruzhinskis, V., Shiktorov, P.

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Determination of transport coefficients by transient photoconductivity measurements von Gasquet, D., Nougier, J.P., Gineste, G.

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Hot phonon-hot electron coupled Boltzmann equations von Fadel, M., Rieger, M., Vaissiere, J.C., Nougier, J.P., Kocevar, P.

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Method for numerically computing the noise of devices von Nougier, J.P., Moatadid, A., Vaissiere, J.C., Gasquet, D.

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Space charge induced in semiconductors by hot carrier regime von Nougier, J.P.

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Intervalley transfers of hot electrons in silicon below 77 K von Nougier, J.P., Rolland, M., Gasquet, D.

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Scattered packet method for the simulation of the spatio-temporal evolution of local perturbations von Gaubert, P., Varani, L., Vaissiere, J.C., Nougier, J.P., Starikov, E., Shiktorov, P., Gruzhinskis, V.

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Metal semiconductor contact: Resistivity and noise von Nougier, J.P., Rolland, M.

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Generation-recombination noise at 77°K in silicon bars and JFETs von van der Ziel, A., Jindal, R., Kim, S.K., Park, H., Nougier, J.P.

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Noise of hot carriers in the channel of n silicon junction gate field effect transistors von Nougier, J.P., Sodini, D., Rolland, M., Gasquet, D., Lecoy, G.

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Low noise “ohmic” contacts on n-type silicon von Rolland, M., Nougier, J.P., Gasquet, D., Alabedra, R.

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Noise and Diffusion in p-type Silicon von Nougier, J.P., Moatadid, A., Vaissiere, J.C.

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