Estimation of minimum electron dose necessary to resolve molecular structure of deoxyribonucleic acid by phase transmission electron microscopy von Nomaguchi, Tsunenori, Kimura, Yoshihide, Takai, Yoshizo

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Molecular-scale imaging of unstained deoxyribonucleic acid fibers by phase transmission electron microscopy von Takai, Yoshizo, Nomaguchi, Tsunenori, Matsushita, Shuhei, Kimura, Yoshihide

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A Compact Aberration Corrector for SEMs with Electrostatic-field formed by Annular and Circular Electrodes von Kawasaki, Tadahiro, Yoshida, Ryuji, Kato, Takeharu, Nomaguchi, Tsunenori, Motomura, Shunichi, Nishinaka, Kenichi, Agemura, Toshihide, Ikuta, Takashi

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Development of Electron Optics System for "ETHOS" High-Performance FIB-SEM von Sato, Shunsuke, Kamiya, Chisato, Hirano, Ryo, Nomaguchi, Tsunenori, Morikawa, Akinari, Suzuki, Hiroyuki, Suzuki, Hidekazu, Yamamoto, Yo

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Development of Objective Aperture Holder for Mounting Compact Cs Corrector on Conventional SEM von Nomaguchi, Tsunenori, Motomura, Shunichi, Nishinaka, Kenichi, Agemura, Toshihide, Kawasaki, Tadahiro, Yoshida, Ryuji, Kato, Takeharu

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Spherical Aberration Correction for SEMs with Electrostatic-type Compact Cs-corrector von Kawasaki, Tadahiro, Yoshida, Ryuji, Kato, Takeharu, Nomaguchi, Tsunenori, Motomura, Shunichi, Nishinaka, Kenichi, Agemura, Toshihide, Tomita, Masahiro, Ikuta, Takashi

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Development of Compact Cs/Cc Corrector with Annular and Circular Electrodes von Kawasaki, Tadahiro, Yoshida, Ryuji, Kato, Takeharu, Nomaguchi, Tsunenori, Agemura, Toshihide, Kodama, Tetsuji, Tomita, Masahiro, Ikuta, Takashi

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Mechanism for adjusting angle of incidence on charged particle beam aperture, and charged particle beam device von Nomaguchi, Tsunenori, Motomura, Shunichi

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Mechanism for Adjusting Angle of Incidence on Charged Particle Beam Aperture, and Charged Particle Beam Device von NOMAGUCHI, Tsunenori, MOTOMURA, Shunichi

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Charged particle beam apparatus von Nomaguchi, Tsunenori, Motomura, Shunichi

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Method for Producing Lamella, Analysis System and Method for Analyzing Sample von SAWADA, Atsushi, NOMAGUCHI, Tsunenori

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Charged Particle Beam Apparatus von NOMAGUCHI, Tsunenori, MOTOMURA, Shunichi

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Charged particle beam device, method for processing sample, and observation method von Nomaguchi, Tsunenori, Mise, Hiromi

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Molecular-scale imaging of unstained deoxyribonucleic acid fibersby phase transmission electron microscopy von Takai, Yoshizo, Nomaguchi, Tsunenori, Matsushita, Shuhei, Kimura, Yoshihide

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Development of computer-assisted minimal-dose system with beam blanker for TEM von Hayashida, Misa, Nomaguchi, Tsunenori, Kimura, Yoshihide, Takai, Yoshizo

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Charged particle beam apparatus von Nomaguchi, Tsunenori, Nishinaka, Kenichi

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Charged Particle Beam Device, Method for Processing Sample, and Observation Method von NOMAGUCHI, Tsunenori, MISE, Hiromi

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Charged Particle Beam Apparatus von NISHINAKA, Kenichi, NOMAGUCHI, Tsunenori

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Charged Particle Beam Device and Sample Thickness Measurement Method von NOMAGUCHI, Tsunenori, SATO, Takahiro

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Development of electrostatic Cs-corrector for SEM using annular and circular electrodes von Kawasaki, Tadahiro, Yoshida, Ryuji, Kato, Takeharu, Motomura, Shunichi, Nomaguchi, Tsunenori, Agemura, Toshihide, Tomita, Masahiro, Ikuta, Takashi

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