Surface-states effects on GaAs FET electrical performance von Ohno, Y., Francis, P., Nogome, M., Takahashi, Y.

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Numerical simulation of drain lag in HJFETs on hole-trap substrates von Nogome, Masanobu, Kunihiro, Kazuaki, Ohno, Yasuo

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Rate-limiting process in drain lag of HJFETs on semi-insulating substrates von Nogome, Masanobu, Kunihiro, Kazuaki, Ohno, Yasuo

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Effects of buried p-layers on substrate-trap induced phenomena in GaAs MESFETs von Kunihiro, K., Nogome, M., Ohno, Y.

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Numerical simulations of surface states effects on GaAs power MESFETs von Francis, P., Ohno, Y., Nogome, M., Takahashi, Y.

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Numerical simulation of drain lag in HJFETs with a p-buffer layer von Nogome, M., Kunihiro, K., Ohno, Y.

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5a-D-16 Electronic Structure of Intercalation Compound Ag_xTiS_2(x=1,1/3) von Nogome, M, Teshima, T, Suzuki, N, Motizuki, k

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5a-D-16 層間化合物Ag_xTiS_2(x=1,1/3)の電子状態 von 能米, 雅信, 手嶋, 達也, 鈴木, 直, 望月, 和子

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