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  1. 1
    Hot-Carrier Degradation and Electric Field and Electron Concentration near Drain Junction in Low-Temperature N-Channel Single Drain and Lightly Doped Drain Polycrystalline Silicon Thin Film Transistors

    Hot-Carrier Degradation and Electric Field and Electron Concentration near Drain Junction in Low-Temperature N-Channel Single Drain and Lightly Doped Drain Polycrystalline Silicon... von Usami, Gen, Nogami, Yukisato, Yajima, Toshihisa, Yamagata, Masahiro, Satoh, Toshifumi, Tango, Hiroyuki


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  2. 2
    Tow-Dimensional Simulation of Electric Field and Carrier Distribution of Low-Temperature n-Channel Poly-Si TFTs

    Tow-Dimensional Simulation of Electric Field and Carrier Distribution of Low-Temperature n-Channel Poly-Si TFTs von Nogami, Yukisato, Satoh, Toshihumi, Tango, Hiroyuki


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