SIMS/ARXPS-A New Technique of Retained Dopant Dose and Profile Measurement of Ultralow-Energy Doping Processes von Shu Qin, Kent Zhuang, Shifeng Lu, McTeer, A., Morinville, W., Noehring, K.

Volltext

Thin-film metrology of silicon-on-insulator materials von Zollner, S., Lee, T.-C., Noehring, K., Konkar, A., Theodore, N. D., Huang, W. M., Monk, D., Wetteroth, T., Wilson, S. R., Hilfiker, J. N.

Volltext

Thermal processing impact on the integrity of HfO2-based high-k gate dielectrics von Xuefeng Lin, Morinville, W., Zhiyong Suo, Zhuang, K., Krasinski, C., Markowitz, D., Noehring, K., Yang Zhou, York, S., Yapa, H., Brown, J., Shifeng Lu

Volltext

Role of collapsin response mediator protein-2 in neurite outgrowth of PC12 cells von Bork, Kaya, Karbe, Yvonne, Pollscheit, Juliane, Glaubitz, Nicole, Nöhring, Sabine, Horstkorte, Rüdiger

Volltext

Biochemical Engineering of Cell Surface Sialic Acids Stimulates Axonal Growth von Buttner, Bettina, Kannicht, Christoph, Schmidt, Carolin, Loster, Klemens, Reutter, Werner, Lee, Hye-Youn, Nohring, Sabine, Horstkorte, Rudiger

Volltext