The effects of ion species and target temperature on topography development on ion bombarded Si von Carter, G., Vishnyakov, V., Martynenko, Yu. V., Nobes, M. J.

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The application of the Huygens principle to surface evolution in inhomogeneous, anisotropic and time-dependent systems von Katardjiev, I V, Carter, G, Nobes, M J

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The diffusion approximation applied to sputter depth profiling von Carter, G., Nobes, M. J.

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Ripple topography development on ion bombarded Si von Carter, G., Vishnyakov, V., Nobes, M.J.

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Topography development on selected inert gas and self-ion bombarded Si von Vishnyakov, V, Carter, G, Goddard, D.T., Nobes, M.J.

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The erosion of copper by reflected sandblasting grains von Carter, G., Bevan, I.J., Katardjiev, I.V., Nobes, M.J.

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Ion-beam-induced topography and compositional changes in depth profiling von Carter, G., Nobes, M. J.

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The evolution of atomic scale topography by sputtering erosion von Carter, G., Nobes, M. J., Stoere, H., Katardjiev, I. V.

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Sputter polishing of surfaces von Carter, G., Nobes, M. J., Katardjiev, I. V.

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Sputtering induced topography development on f.c.c. metals von Carter, G., Nobes, M. J., Whitton, J. L.

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An altered layer model for sputter-profiling von Carter, G., Katardjiev, I. V., Nobes, M. J.

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A kinematic wave description of ripple development on sand-blasted ductile solids von Carter, G., Nobes, M.J.

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Analytic, geometric and computer techniques for the prediction of morphology evolution of solid surfaces from multiple processes von Nobes, M J, Katardjiev, I V, Carter, G, Smith, R

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Reproducibility and stability in surface morphological evolution von Carter, G., Katardjiev, I. V., Nobes, M. J.

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Metal contaminant accumulation in ion beam induced film growth von Carter, G., Nobes, M. J., Mclaren, M. G.

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The deduction of ballistic atomic mixing rates from high fluence ion implant collection depth distributions von Carter, G., Nobes, M.J., Katardjiev, I.V.

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The production of repetitive surface features by oblique incidence ion bombardment von Carter, G., Nobes, M. J., Katardjiev, I. V.

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The effects of model parameter variations on high-fluence ion implantation von Carter, G, Nobes, MJ, Katardjiev, IV, Abril, I, Gras-Marti, A, Jimenez-Rodriguez, JJ, Peinador, JA

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The effect of atomic-scale etch pit formation on depth resolution in sputter profiling von Carter, G., Nobes, M. J., Katardjiev, I. V.

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The steady state in net erosion and net growth regimes during simultaneous ion bombardment and atomic deposition processes von Katardjiev, I. V., Carter, G., Nobes, M. J., Berg, S., Nender, C.

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