On groups of central type, non-degenerate and bijective cohomology classes von David, Nir Ben, Ginosar, Yuval

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On groups of I-type and involutive Yang–Baxter groups von Ben David, Nir, Ginosar, Yuval

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Isotropy in group cohomology von Ben David, Nir, Ginosar, Yuval, Meir, Ehud

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Isotropy in Group Cohomology von Nir Ben David, Ginosar, Yuval, Meir, Ehud

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CALIBRATED MEASUREMENT OF OVERLAY ERROR USING SMALL TARGETS von GHINOVKER, Mark, FELER, Yoel, BEN DAVID, Nir, UZIEL, Yoram

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On groups of \(I\)-type and involutive Yang-Baxter groups von Nir Ben David, Ginosar, Yuval

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Systems and methods for improved metrology for semiconductor device wafers von Simon, Yossi, Negri, Daria, Ben David, Nir, Bachar, Ohad, Manassen, Amnon, Uziel, Yoram, Lavert, Etay, Yerushalmi, Liran

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System, a method and a computer program product for size estimation von Dodzin, Nir Ben-David, Amzaleg, Moshe

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On groups of $I$-type and involutive Yang-Baxter groups von David, Nir Ben, Ginosar, Yuval

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SYSTEMS AND METHODS FOR ROTATIONAL CALIBRATION OF METROLOGY TOOLS von NOVIKOV, Alexander, FELER, Yoel, BEN DAVID, Nir, UZIEL, Yoram, DOLEV, Ido, PASKOVER, Yuri, MANASSEN, Amnon

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SYSTEMS AND METHODS FOR ROTATIONAL CALIBRATION OF METROLOGY TOOLS von Paskover, Yuri, Ben David, Nir, Manassen, Amnon, Feler, Yoel, Novikov, Alexander, Uziel, Yoram, Dolev, Ido

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SYSTEMS AND METHODS FOR IMPROVED METROLOGY FOR SEMICONDUCTOR DEVICE WAFERS von BACHAR, Ohad, BEN DAVID, Nir, UZIEL, Yoram, NEGRI, Daria, LAVERT, Etay, SIMON, Yossi, MANASSEN, Amnon, YERUSHALMI, Liran

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SYSTEMS AND METHODS FOR IMPROVED METROLOGY FOR SEMICONDUCTOR DEVICE WAFERS von Simon, Yossi, Negri, Daria, Ben David, Nir, Bachar, Ohad, Manassen, Amnon, Uziel, Yoram, Lavert, Etay, Yerushalmi, Liran

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작은 타겟을 사용하는 오버레이 에러의 교정된 측정 von GHINOVKER MARK, UZIEL YORAM, FELER YOEL, BEN DAVID NIR

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SYSTEM AND METHOD FOR ANALYZING A SAMPLE WITH A DYNAMIC RECIPE BASED ON ITERATIVE EXPERIMENTATION AND FEEDBACK von MILO, Renan, BEN DAVID, Nir, VOLKOVICH, Roie, YAZIV, Tal, GOLOTSVAN, Anna

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Calibration measurements for superposition errors using small targets von BEN-DAVID NIR, GENOUK, MIKHAIL, FELER YOEL, UZIEL YOHAN

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Inspection of a lithographic mask that is protected by a pellicle von Dodzin, Nir Ben-David, Litman, Alon, Karabekov, Albert, Goldenshtein, Alex

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SYSTEM, A METHOD AND A COMPUTER PROGRAM PRODUCT FOR SIZE ESTIMATION von AMZALEG MOSHE, BEN-DAVID NIR

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System, a method and a computer program product for CAD-based registration von DODZIN NIR BEN-DAVID, GOREN ZVI

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SYSTEM AND METHOD FOR ERROR REDUCTION IN METROLOGY MEASUREMENTS von LAHAV, Oren, BEN DAVID, Nir, DROR, Chen, VOLKOVICH, Roie, KATZ, Shlomit, DIRAWI, Rawi, MANASSEN, Amnon, YERUSHALMI, Liran, GOLOTSVAN, Anna

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