Particle evolution in Mg–Zn–Zr alloy processed by integrated extrusion and equal channel angular pressing: Evaluation by electron microscopy and synchrotron small-angle X-ray scatt... von Orlov, Dmitry, Pelliccia, Daniele, Fang, Xiya, Bourgeois, Laure, Kirby, Nigel, Nikulin, Andrei Y., Ameyama, Kei, Estrin, Yuri

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Research of software verification methods for waste management and review the waste treatment legislation in Russia von Epifancev, Kirill, Mishura, Tamara, Kozlova, Olga, Nikulin, Andrei

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Experimental characterization of the coherence properties of hard x-ray sources von Pelliccia, Daniele, Nikulin, Andrei Y, Moser, Herbert O, Nugent, Keith A

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Structural Investigation of Three-Dimensional Self-Assembled PbS Binary Superlattices von Altamura, Davide, Corricelli, Michela, De Caro, Liberato, Guagliardi, Antonietta, Falqui, Andrea, Genovese, Alessandro, Nikulin, Andrei Y, Curri, M. Lucia, Striccoli, Marinella, Giannini, Cinzia

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Dynamic Rangefinding Wearable Hardware-Software System for Visually Impaired, Based on Double-Type Sensors von Nikulin, Andrei V., Smirnov, Viktor V., Kazmina, Anna S., Babina, Alina A.

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3-D X-ray Diffraction Imaging with Nanoscale Resolution Using Incoherent Radiation von Nikulin, Andrei Y, Dilanian, Ruben A, Zatsepin, Nadia A, Gable, Brian M, Muddle, Barry C, Souvorov, Alexei Y, Nishino, Yoshinori, Ishikawa, Tetsuya

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Industrial Injuries Appraisal in Mines of JSC “SUEK Kuzbass” von Istomin, Ruslan, Kovshov, Stanislav, Sotiriu, Alexandra, Nikulin, Andrei

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X-ray evaluation of microroughness of mechanochemically polished silicon surfaces von SAKATA, O, NIKULIN, A. Y, HASHIZUME, H

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On influence of collimating slit imperfections on the quality of experimental data in high-resolution x-ray diffraction von Darahanau, Aliaksandr V., Nikulin, Andrei Y., Dilanian, Ruben A.

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Real-time in situ nanoclustering during initial stages of artificial aging of Al-Cu alloys von Zatsepin, Nadia A., Dilanian, Ruben A., Nikulin, Andrei Y., Gao, Xiang, Muddle, Barry C., Matveev, Victor N., Sakata, Osami

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X-ray diffraction imaging of Al 2 O 3 nanoparticles embeddedin an amorphous matrix von Dilanian, Ruben A., Nikulin, Andrei Y.

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X-ray diffraction imaging of Al2O3 nanoparticles embedded in an amorphous matrix von Dilanian, Ruben A., Nikulin, Andrei Y.

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Application of phase-retrieval x-ray diffractometry to carbon doped Si Ge ( C ) ∕ Si ( C ) superlattice structures. II. High resolution reconstruction using neural network root fin... von Dilanian, Ruben A., Nikulin, Andrei Y., Darahanau, Aliaksandr V., Hester, James, Zaumseil, Peter

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Atomistic structure of SiO2∕Si∕SiO2 quantum wells with an apparently crystalline silicon oxide von Cho, Eun-Chel, Green, Martin A., Xia, James, Corkish, Richard, Nikulin, Andrei

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Early detection of nanoparticle growth from x-ray reciprocal space mapping von Zatsepin, Nadia A., Dilanian, Ruben A., Nikulin, Andrei Y., Gable, Brian M., Muddle, Barry C., Sakata, Osami

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Application of phase-retrieval x-ray diffractometry to carbon doped SiGe(C)∕Si(C) superlattice structures. II. High resolution reconstruction using neural network root finder techn... von Dilanian, Ruben A., Nikulin, Andrei Y., Darahanau, Aliaksandr V., Hester, James, Zaumseil, Peter

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Application of phase-retrieval x-ray diffractometry to carbon doped SiGe(C)/Si(C) superlattice structures von Siu, Karen K.-W., Nikulin, Andrei Y., Zaumseil, Peter, Yamazaki, Hiroshi, Ishikawa, Tetsuya

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Unambiguous x-ray phase retrieval from Fraunhofer diffraction data von Siu, Karen K-W, Nikulin, Andrei Y., Wells, Peter, Harvey, Erol, Bigault, Thierry, Freund, Andreas K., Ishikawa, Tetsuya

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Experimental Studies of 90° Bragg Reflection from a Sub-Micron In x Ga 1-x As Single-Crystal Film Deposited on a GaAs Substrate von Nikulin, Andrei Y., Tamasaku, Kenji, Usher, Brian F., Ishikawa, Tetsuya

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Structure of Fe3Si/Al/Fe3Si thin film stacks on GaAs(001) von Jenichen, Bernd, Jahn, Uwe, Nikulin, Andrei, Herfort, Jens, Holm Kirmse

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