Structural and transport properties in alloyed Ti/Al Ohmic contacts formed on p-type Al-implanted 4H-SiC annealed at high temperature von Frazzetto, A, Giannazzo, F, Nigro, R Lo, Raineri, V, Roccaforte, F

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Critical issues for interfaces to p-type SiC and GaN in power devices von Roccaforte, F., Frazzetto, A., Greco, G., Giannazzo, F., Fiorenza, P., Nigro, R. Lo, Saggio, M., Leszczyński, M., Pristawko, P., Raineri, V.

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Thermal stability of the current transport mechanisms in Ni-based Ohmic contacts on n- and p-implanted 4H-SiC von Vivona, M, Greco, G, Giannazzo, F, Lo Nigro, R, Rascunà, S, Saggio, M, Roccaforte, F

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Improvement of Ti/Al/Ti Ohmic contacts on AlGaN/GaN heterostructures by insertion of a thin carbon interfacial layer von Greco, G., Di Franco, S., Lo Nigro, R., Bongiorno, C., Spera, M., Badalà, P., Iucolano, F., Roccaforte, F.

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Electrical and structural properties of surfaces and interfaces in Ti/Al/Ni Ohmic contacts to p-type implanted 4H-SiC von Vivona, M., Greco, G., Bongiorno, C., Lo Nigro, R., Scalese, S., Roccaforte, F.

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Aluminum oxide nucleation in the early stages of atomic layer deposition on epitaxial graphene von Schilirò, E., Lo Nigro, R., Panasci, S.E., Gelardi, F.M., Agnello, S., Yakimova, R., Roccaforte, F., Giannazzo, F.

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Aluminum Frenkel defects cause hysteresis in Al2O3/AlGaN capacitors von Deretzis, I., Fiorenza, P., Fazio, T., Schilirò, E., Lo Nigro, R., Greco, G., Fisicaro, G., Roccaforte, F., La Magna, A.

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A Simple Route to the Synthesis of Pr2O3 High-k Thin Films von Lo Nigro, R., Toro, R.G., Malandrino, G., Raineri, V., Fragalà, I.L.

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Ti/Al/W Ohmic contacts to p-type implanted 4H-SiC von Vivona, M., Greco, G., Lo Nigro, R., Bongiorno, C., Roccaforte, F.

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Microstructural and Optical Properties Modifications Induced by Plasma and Annealing Treatments of Lanthanum Oxide Sol−Gel Thin Films von Armelao, L, Pascolini, M, Bottaro, G, Bruno, G, Giangregorio, M. M, Losurdo, M, Malandrino, G, Lo Nigro, R, Fragalà, M. E, Tondello, E

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Nanoscale structural and electrical evolution of Ta- and Ti-based contacts on AlGaN/GaN heterostructures von Greco, G., Giannazzo, F., Iucolano, F., Lo Nigro, R., Roccaforte, F.

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Structural–optical study of high-dielectric-constant oxide films von Losurdo, M., Giangregorio, M.M., Luchena, M., Capezzuto, P., Bruno, G., Toro, R.G., Malandrino, G., Fragalà, I.L., Nigro, R. Lo

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Recent advances on dielectrics technology for SiC and GaN power devices von Roccaforte, F., Fiorenza, P., Greco, G., Vivona, M., Lo Nigro, R., Giannazzo, F., Patti, A., Saggio, M.

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Electro-structural evolution and Schottky barrier height in annealed Au/Ni contacts onto p-GaN von Greco, G., Prystawko, P., Leszczyński, M., Lo Nigro, R., Raineri, V., Roccaforte, F.

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Effect of SiO2 interlayer on the properties of Al2O3 thin films grown by plasma enhanced atomic layer deposition on 4H‐SiC substrates von Schilirò, E., Fiorenza, P., Di Franco, S., Bongiorno, C., Saggio, M., Roccaforte, F., Lo Nigro, R.

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High permittivity cerium oxide thin films on AlGaN/GaN heterostructures von Fiorenza, P., Greco, G., Fisichella, G., Roccaforte, F., Malandrino, G., Lo Nigro, R.

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From micro- to nanotransport properties in Pr2O3-based thin layers von Fiorenza, P., Lo Nigro, R., Raineri, V., Lombardo, S., Toro, R. G., Malandrino, G., Fragalà, I. L.

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Ti/Al‐based contacts to p‐type SiC and GaN for power device applications von Roccaforte, F., Vivona, M., Greco, G., Lo Nigro, R., Giannazzo, F., Di Franco, S., Bongiorno, C., Iucolano, F., Frazzetto, A., Rascunà, S., Patti, A., Saggio, M.

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Core-shell Zn-doped TiO2-ZnO nanofibers fabricated via a combination of electrospinning and metal-organic chemical vapour deposition von Fragalà, M. E, Cacciotti, I, Aleeva, Y, Lo Nigro, R, Bianco, A, Malandrino, G, Spinella, C, Pezzotti, G, Gusmano, G

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Praseodymium Silicate as a High-k Dielectric Candidate: An Insight into the Pr2O3-Film/Si-Substrate Interface Fabricated Through a Metal-Organic Chemical Vapor Deposition Process von Lo Nigro, R., Toro, R. G., Malandrino, G., Condorelli, G. G., Raineri, V., Fragalà, I. L.

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