Gradients of microstructure, stresses and mechanical properties in a multi-layered diamond thin film revealed by correlative cross-sectional nano-analytics von Gruber, David P., Todt, Juraj, Wöhrl, Nicolas, Zalesak, Jakub, Tkadletz, Michael, Kubec, Adam, Niese, Sven, Burghammer, Manfred, Rosenthal, Martin, Sternschulte, Hadwig, Pfeifenberger, Manuel J., Sartory, Bernhard, Keckes, Jozef

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Rapid aberration correction for diffractive X-ray optics by additive manufacturing: erratum von Seiboth, Frank, Kubec, Adam, Schropp, Andreas, Niese, Sven, Gawlitza, Peter, Garrevoet, Jan, Galbierz, Vanessa, Achilles, Silvio, Patjens, Svenja, Stuckelberger, Michael E., David, Christian, Schroer, Christian G.

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Nanobeam X-ray fluorescence and diffraction computed tomography on human bone with a resolution better than 120 nm von Palle, Jonas, Wittig, Nina Kølln, Kubec, Adam, Niese, Sven, Rosenthal, Martin, Burghammer, Manfred, Grünewald, Tilman A., Birkedal, Henrik

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Rapid aberration correction for diffractive X-ray optics by additive manufacturing von Seiboth, Frank, Kubec, Adam, Schropp, Andreas, Niese, Sven, Gawlitza, Peter, Garrevoet, Jan, Galbierz, Vanessa, Achilles, Silvio, Patjens, Svenja, Stuckelberger, Michael E., David, Christian, Schroer, Christian G.

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Nanobeam X-ray fluorescence and diffraction computed tomography on human bone with a resolution better than 120 nm von Palle, Jonas, Wittig, Nina Kolln, Kubec, Adam, Niese, Sven, Rosenthal, Martin, Burghammer, Manfred, Grunewald, Tilman A, Birkedal, Henrik

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Point focusing with flat and wedged crossed multilayer Laue lenses von Kubec, Adam, Melzer, Kathleen, Gluch, Jürgen, Niese, Sven, Braun, Stefan, Patommel, Jens, Burghammer, Manfred, Leson, Andreas

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Full-field X-ray microscopy with crossed partial multilayer Laue lenses von Niese, Sven, Krüger, Peter, Kubec, Adam, Braun, Stefan, Patommel, Jens, Schroer, Christian G, Leson, Andreas, Zschech, Ehrenfried

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A novel micro-double cantilever beam (micro-DCB) test in an X-ray microscope to study crack propagation in materials and structures von Kutukova, Kristina, Niese, Sven, Gelb, Jeff, Dauskardt, Reinhold, Zschech, Ehrenfried

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Multilayer Laue Lenses (MLL) with 45 mm Focal Length as Optics for In-situ Nanoindentation Experiments von Kubec, Adam, Niese, Sven, Gluch, Jurgen, Rosenthal, Martin, Todt, Juraj, Keckes, Jozef, Gawlitza, Peter

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FIB sample preparation for X-ray microscopy and ROI target cross-sectioning von Zschech, Ehrenfried, Gluch, Jürgen, Rosenkranz, Rüdiger, Standke, Yvonne, Niese, Sven

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Fabrication of customizable wedged multilayer Laue lenses by adding a stress layer von Niese, Sven, Krüger, Peter, Kubec, Adam, Laas, Roman, Gawlitza, Peter, Melzer, Kathleen, Braun, Stefan, Zschech, Ehrenfried

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Ptychography with multilayer Laue lenses von Kubec, Adam, Braun, Stefan, Niese, Sven, Krüger, Peter, Patommel, Jens, Hecker, Michael, Leson, Andreas, Schroer, Christian G.

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NanoXCT - A High-Resolution Technique For TSV Characterization von Niese, Sven, Krueger, Peter, Zschech, Ehrenfried

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X-ray Microscopy and Tomography of Hydrogen Storage Materials von Gluch, Jürgen, Niese, Sven, Röntzsch, Lars, Zschech, Ehrenfried

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A dedicated illumination for full-field X-ray microscopy with multilayer Laue lenses von Niese, Sven, Braun, Stefan, Dietsch, Reiner, Gluch, Jürgen, Holz, Thomas, Huber, Norman, Kubec, Adam, Zschech, Ehrenfried

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A New In Situ Microscopy Approach to Study the Degradation and Failure Mechanisms of Time-Dependent Dielectric Breakdown: Set-Up and Opportunities von Liao, Zhongquan, Gall, Martin, Yeap, Kong Boon, Sander, Christoph, Aubel, Oliver, Mühle, Uwe, Gluch, Jürgen, Niese, Sven, Standke, Yvonne, Rosenkranz, Rüdiger, Löffler, Markus, Vogel, Norman, Beyer, Armand, Engelmann, Hans-Jürgen, Guttmann, Peter, Schneider, Gerd, Zschech, Ehrenfried

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Lab-based in-situ X-ray microscopy - methodical developments and applications in materials science and microelectronics von Niese, Sven

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An experimental methodology for the in-situ observation of the time-dependent dielectric breakdown mechanism in Copper/low-k on-chip interconnect structures von Kong Boon Yeap, Gall, M., Sander, C., Niese, S., Zhongquan Liao, Ritz, Y., Rosenkranz, R., Muhle, U., Gluch, J., Zschech, E., Aubel, O., Beyer, A., Hennesthal, C., Hauschildt, M., Talut, G., Poppe, J., Vogel, N., Engelmann, H., Stauffer, D., Major, R., Warren, O.

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Fabrication of customizable wedged multilayer Laue lenses by adding a stress layer von NIESE, Sven, KRÜGER, Peter, KUBEC, Adam, LAAS, Roman, GAWLITZA, Peter, MELZER, Kathleen, BRAUN, Stefan, ZSCHECH, Ehrenfried

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Nanoscale stress distributions and microstructural changes at scratch track cross-sections of a deformed brittle-ductile CrN-Cr bilayer von Meindlhumer, Michael, Zalesak, Jakub, Ecker, Werner, Rosenthal, Martin, Niese, Sven, Gawlitza, Peter, Hruby, Hynek, Mitterer, Christian, Daniel, Rostislav, Keckes, Jozef, Todt, Juraj

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