Virtual Reality Exposure Therapy for Driving Phobia Disorder: System Design and Development von Trappey, Amy, Trappey, Charles V, Chang, Chia-Ming, Kuo, Routine R.T, Lin, Aislyn P.C, Nieh, C.H

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Consideration of kinetics on intermetallics formation in solid-solution high entropy alloys von Chou, T.H., Huang, J.C., Yang, C.H., Lin, S.K., Nieh, T.G.

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Effects of B2 precipitate size on transformation-induced plasticity of Cu–Zr–Al glassy alloys von Kuo, C.N., Huang, J.C., Li, J.B., Jang, J.S.C., Lin, C.H., Nieh, T.G.

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Extended elastic region in nanocrystalline HCP and FCC metals under nano-tension loading von Kuan, S.Y., Huang, J.C., Chen, Y.H., Chang, C.H., Hsieh, C.H., Wang, J.H., Nian, Y.C., Ju, S.P., Nieh, T.G., Chen, S.H., Hwang, Y.M.

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Millisecond Anneal and Short-Channel Effect Control in Si CMOS Transistor Performance von Nieh, C.F., Ku, K.C., Chen, C.H., Chang, H., Wang, L.T., Huang, L.P., Sheu, Y.M., Wang, C.C., Lee, T.L., Chen, S.C., Liang, M.S., Gong, J.

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A Millisecond-Anneal-Assisted Selective Fully Silicided (FUSI) Gate Process von Da-Wen Lin, Wang, M., Ming-Lung Cheng, Yi-Ming Sheu, Tarng, B., Che-Min Chu, Chun-Wen Nieh, Chia-Ping Lo, Wen-Chi Tsai, Lin, R., Shyh-Wei Wang, Kuan-Lun Cheng, Chii-Ming Wu, Ming-Ta Lei, Chung-Cheng Wu, Diaz, C.H., Ming-Jer Chen

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Relaxation-Free Strained SiGe with Super Anneal for 32nm High Performance PMOS and beyond von Yu, M.H., Li, J.H., Lin, H.H., Chen, C.H., Ku, K.C., Nieh, C.F., Hisa, H., Sheu, Y.M., Tsai, C.W., Wang, Y.L., Chu, H.Y., Cheng, H.C., Lee, T.L., Chen, S.C., Liang, M.S.

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A highly scaled, high performance 45 nm bulk logic CMOS technology with 0.242 μm2 SRAM cell von Kuan-Lun Cheng, Wu, C.C., Wang, Y.P., Lin, D.W., Chu, C.M., Tarng, Y.Y., Lu, S.Y., Yang, S.J., Hsieh, M.H., Liu, C.M., Fu, S.P., Chen, J.H., Lin, C.T., Lien, W.Y., Huang, H.Y., Wang, P.W., Lin, H.H., Lee, D.Y., Huang, M.J., Nieh, C.F., Lin, L.T., Chen, C.C., Chang, W., Chiu, Y.H., Wang, M.Y., Yeh, C.H., Chen, F.C., Chang, Y.H., Wang, S.C., Hsieh, H.C., Lei, M.D., Goto, K., Tao, H.J., Cao, M., Tuan, H.C., Diaz, C.H., Mii, Y.J., Wu, C.M.

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