Heavy Ion Induced Degradation in SiC Schottky Diodes: Bias and Energy Deposition Dependence von Javanainen, Arto, Galloway, Kenneth F., Nicklaw, Christopher, Bosser, Alexandre L., Ferlet-Cavrois, Veronique, Lauenstein, Jean-Marie, Pintacuda, Francesco, Reed, Robert A., Schrimpf, Ronald D., Weller, Robert A., Virtanen, Ari

Volltext

Heavy-Ion-Induced Degradation in SiC Schottky Diodes: Incident Angle and Energy Deposition Dependence von Javanainen, Arto, Turowski, Marek, Galloway, Kenneth F., Nicklaw, Christopher, Ferlet-Cavrois, Veronique, Bosser, Alexandre, Lauenstein, Jean-Marie, Muschitiello, Michele, Pintacuda, Francesco, Reed, Robert A., Schrimpf, Ronald D., Weller, Robert A., Virtanen, A.

Volltext

Heavy Ion Induced Degradation in SiC Schottky Diodes: Bias and Energy Deposition Dependence von Javanainen, Arto, Galloway, Kenneth F., Nicklaw, Christopher, Bosser, Alexandre L., Ferlet-Cavrois, Veronique, Lauenstein, Jean-Marie, Pintacuda, Francesco, Reed, Robert A., Schrimpf, Ronald D., Weller, Robert A., Virtanen, Ari Juha

Volltext

Multi-Level Modeling of Total Ionizing Dose in a-SiO2: First Principles to Circuits von Nicklaw, Christopher J

Volltext bestellen

SYSTEM AND METHOD FOR VERIFIED REPORTING OF ILLNESS STATES USING DISPARATE DATASETS von Narula, Sumeet, Nicklaw, Carina, Kohl, Kristopher, McDonough, Gavin, Jones, Christopher, Hood, Derek, Weight, Matt

Volltext bestellen