Measurement of bandgap energies in low-k organosilicates von Nichols, M. T., Li, W., Pei, D., Antonelli, G. A., Lin, Q., Banna, S., Nishi, Y., Shohet, J. L.

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Effect of the dielectric–substrate interface on charge accumulation from vacuum ultraviolet irradiation of low-k porous organosilicate dielectrics von Sinha, H., Sehgal, A., Ren, H., Nichols, M.T., Tomoyasu, M., Russell, N.M., Nishi, Y., Shohet, J.L.

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The effects of vacuum ultraviolet radiation on low- k dielectric films von Sinha, H., Ren, H., Nichols, M. T., Lauer, J. L., Tomoyasu, M., Russell, N. M., Jiang, G., Antonelli, G. A., Fuller, N. C., Engelmann, S. U., Lin, Q., Ryan, V., Nishi, Y., Shohet, J. L.

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Time-dependent dielectric breakdown of plasma-exposed porous organosilicate glass von Nichols, M. T., Sinha, H., Wiltbank, C. A., Antonelli, G. A., Nishi, Y., Shohet, J. L.

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The effect of water uptake on the mechanical properties of low-k organosilicate glass von Guo, X., Jakes, J. E., Nichols, M. T., Banna, S., Nishi, Y., Shohet, J. L.

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The effects of plasma exposure and vacuum ultraviolet irradiation on photopatternable low-k dielectric materials von Nichols, M. T., Mavrakakis, K., Lin, Q., Shohet, J. L.

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Charge Trapping within UV and Vacuum UV Irradiated Low-k Porous Organosilicate Dielectrics von Lauer, J. L., Sinha, H., Nichols, M. T., Antonelli, G. A., Nishi, Y., Shohet, J. L.

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Defects in low-k organosilicate glass and their response to processing as measured with electron-spin resonance von Ren, H., Nichols, M. T., Jiang, G., Antonelli, G. A., Nishi, Y., Shohet, J. L.

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Effect of vacuum ultraviolet and ultraviolet Irradiation on capacitance-voltage characteristics of low-k-porous organosilicate dielectrics von Sinha, H., Lauer, J. L., Nichols, M. T., Antonelli, G. A., Nishi, Y., Shohet, J. L.

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Surface photoconductivity of organosilicate glass dielectrics induced by vacuum-ultraviolet radiation von Zheng, H., Nichols, M. T., Pei, D., Nishi, Y., Shohet, J. L.

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Surface potential due to charge accumulation during vacuum ultraviolet exposure for high- k and low- k dielectrics von Ren, H., Sinha, H., Sehgal, A., Nichols, M. T., Antonelli, G. A., Nishi, Y., Shohet, J. L.

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Defects in low- k organosilicate glass and their response to processingas measured with electron-spin resonance von Ren, H., Nichols, M. T., Jiang, G., Antonelli, G. A., Nishi, Y., Shohet, J. L.

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Effect of vacuum ultraviolet and ultraviolet irradiation on mobile charges in the bandgap of low- k -porous organosilicate dielectrics von Sinha, H., Nichols, M. T., Sehgal, A., Tomoyasu, M., Russell, N. M., Antonelli, G. A., Nishi, Y., Shohet, J. L.

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Russian democracy and social capital von Nichols, Thomas M.

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The impact of two harvesting systems on residual stems in a partially cut stand of northern hardwoods von Nichols, M.T, Lemin Jr, R.C, Ostrofsky, W.D

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Effect of vacuum ultraviolet and ultraviolet Irradiationon capacitance-voltage characteristics of low-k-porousorganosilicate dielectrics von Sinha, H., Lauer, J. L., Nichols, M. T., Antonelli, G. A., Nishi, Y., Shohet, J. L.

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An electron microscope investigation of Auer bodies in myeloblastic leukemia von Nichols, T M

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(Invited) Dielectric Damage von Shohet, J. Leon, Lin, Qinghuang, King, Sean W., Ren, He, Banna, Samer, Jakes, Joseph E., Agasie, Robert J., Naik, Mehul, Nishi, Yoshio, Nichols, Michael T., Mavrakakis, Konstantinos, Hsu, Kaiwen, Guo, Xiangyu, Pei, Dongfei, Li, Weiyi, Choudhury, Faraz, Zheng, Huifeng

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"An Electoral Mutiny?" Zhirinovsky and the Russian Armed Forces von NICHOLS, THOMAS M.

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Recent results from the British Columbia screening program for cervical cancer von Boyes, D.A., Nichols, T.M., Millner, A.M., Worth, A.J.

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