Postdetonation nuclear debris for attribution von Fahey, A. J., Zeissler, C. J., Newbury, D. E., Davis, J., Lindstrom, R. M.

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The electron microscope: the materials characterization tool of the millennium von Newbury, D.E., Williams, D.B.

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Maximum pixel spectrum: a new tool for detecting and recovering rare, unanticipated features from spectrum image data cubes von BRIGHT, D. S., NEWBURY, D. E.

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High‐resolution, energy‐dispersive microcalorimeter spectrometer for X‐ray microanalysis von WOLLMAN, D. A., IRWIN, K. D., HILTON, G. C., DULCIE, L. L., NEWBURY, D. E., MARTINIS, J. M.

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Solidification of Ni-Re Peritectic Alloys von Boettinger, W. J., Newbury, D. E., Ritchie, N. W. M., Williams, M. E., Kattner, U. R., Lass, E. A., Moon, K.-W., Katz, M. B., Perepezko, J. H.

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Scanning Electron Microscopy and X-Ray Microanalysis von Goldstein, Joseph I, Newbury, Dale E, Michael, Joseph R, Ritchie, Nicholas W. M, Scott, John Henry J, Joy, David C

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Exploring the limits of EDS microanalysis: rare earth element analyses von Ritchie, N W M, Newbury, D E, Lowers, H, Mengason, M

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Examination of Multiphase (Zr,Ti)(V,Cr,Mn,Ni)2 Ni-MH Electrode Alloys: Part I. Dendritic Solidification Structure von Boettinger, W.J., Newbury, D.E., Wang, K., Bendersky, L.A., Chiu, C., Kattner, U.R., Young, K., Chao, B.

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Examination of Multiphase (Zr,Ti)(V,Cr,Mn,Ni)2 Ni-MH Electrode Alloys: Part II. Solid-State Transformation of the Interdendritic B2 Phase von Bendersky, L. A., Wang, K., Boettinger, W. J., Newbury, D. E., Young, K., Chao, B.

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How To Do Really Bad SEM/EDS Quantitative Analysis, and Never Even Notice von Newbury, D.E., Ritchie, N.W.

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The use of lead isotopic abundances in trace uranium samples for nuclear forensics analysis von Fahey, A. J., Ritchie, N. W. M., Newbury, D. E., Small, J. A.

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"Standardless" Quantitative Electron Probe Microanalysis with Energy-Dispersive X-ray Spectrometry: Is It Worth the Risk? von Newbury, Dale E, Swyt, Carol R, Myklebust, Robert L

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Microcalorimeter energy‐dispersive spectrometry using a low voltage scanning electron microscope von Wollman, D. A., Nam, S. W., Hilton, G. C., Irwin, K. D., Bergren, N. F., Rudman, D. A., Martinis, J. M., Newbury, D. E.

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Trace elemental analysis at nanometer spatial resolution by parallel-detection electron energy loss spectroscopy von Leapman, R. D, Newbury, D. E

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Measures for spectral quality in low-voltage X-ray microanalysis von Newbury, Dale E.

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Visibility of objects in computer simulations of noisy micrographs von Bright, D S, Newbury, D E, Steel, E B

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Superconducting transition-edge-microcalorimeter X-ray spectrometer with 2 eV energy resolution at 1.5 keV von Wollman, D.A, Nam, S.W, Newbury, D.E, Hilton, G.C, Irwin, K.D, Bergren, N.F, Deiker, S, Rudman, D.A, Martinis, J.M

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Preface for special issue of Surface and Interface Analysis with the proceedings of the NIST workshop on 'Modeling electron transport for applications in electron and X-ray analysi... von Powell, C. J., Newbury, D. E.

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Concentration histogram imaging: A scatter diagram technique for viewing two or three related images von Bright, D. S, Newbury, D. E

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Trace Analysis Is Worthless If the Peaks Are Misidentified von Newbury, D.E., Ritchie, N.W.

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