Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects von de Oliveira, Adria B., Tambara, Lucas A., Benevenuti, Fabio, Benites, Luis A. C., Added, Nemitala, Aguiar, Vitor A. P., Medina, Nilberto H., Silveira, Marcilei A. G., Kastensmidt, Fernanda L.

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Neutron radiation effects on an electronic system on module von Lo Presti, Domenico, Medina, Nilberto H., Guazzelli, Marcilei A., Moralles, Mauricio, Aguiar, Vitor A. P., Oliveira, José R. B., Added, Nemitala, Macchione, Eduardo L. A., Siqueira, Paulo de Tarso D., Zahn, Guilherme, Genezini, Frederico, Bonanno, Danilo, Gallo, Giuseppe, Russo, Salvatore, Sgouros, Onoufrios, Muoio, Annamaria, Pandola, Luciano, Cappuzzello, Francesco

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Analyzing the Influence of the Angles of Incidence and Rotation on MBU Events Induced by Low LET Heavy Ions in a 28-nm SRAM-Based FPGA von Tonfat, Jorge, Lima Kastensmidt, Fernanda, Artola, Laurent, Hubert, Guillaume, Medina, Nilberto H., Added, Nemitala, Aguiar, Vitor A. P., Aguirre, Fernando, Macchione, Eduardo L. A., Silveira, Marcilei A. G.

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Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effects von Benfica, Juliano, Green, Bruno, Porcher, Bruno C., Bolzani Poehls, Leticia, Vargas, Fabian, Medina, Nilberto H., Added, Nemitala, de Aguiar, Vitor A. P., Macchione, Eduardo L. A., Aguirre, Fernando, Silveira, Marcilei A. G., Perez, Martin, Sofo Haro, Miguel, Sidelnik, Ivan, Blostein, Jeronimo, Lipovetzky, Jose, Bezerra, Eduardo A.

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Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge von Aguiar, Vitor A. P., Medina, Nilberto H., Added, Nemitala, Alberton, Saulo G., Macchione, Eduardo L. A., Guazzelli, Marcilei A., Melo, Marco A. A., Oliveira, Juliano A., Giacomini, Renato C., Aguirre, Fernando R., Allegro, Paula R. P., Zaggato, Hellen C. S., Sayeg, Isaac J.

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Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA von Benites, Luis A. C., Benevenuti, Fabio, De Oliveira, Adria B., Kastensmidt, Fernanda L., Added, Nemitala, Aguiar, Vitor A. P., Medina, Nilberto H., Guazzelli, Marcilei A.

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Unsupervised machine learning application to identify single-event transients (SETs) from noise events in MOSFET transistor ionizing radiation effects von Allegro, Paula R.P., Toufen, Dennis L., Aguiar, Vitor A.P., dos Santos, Lucas S.A., de Oliveira, William N., Added, Nemitala, Medina, Nilberto H., Macchione, Eduardo L.A., Alberton, Saulo G., Guazzelli, Marcilei A., Melo, Marco A.A., Oliveira, Juliano A.

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Lockstep Dual-Core ARM A9: Implementation and Resilience Analysis Under Heavy Ion-Induced Soft Errors von Barros de Oliveira, Adria, Severino Rodrigues, Gennaro, Lima Kastensmidt, Fernanda, Added, Nemitala, Macchione, Eduardo L. A., Aguiar, Vitor A. P., Medina, Nilberto H., Silveira, Marcilei A. G.

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Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits von Goerl, Roger, Villa, Paulo, Vargas, Fabian L., Marcon, César A., Medina, Nilberto H., Added, Nemitala, Guazzelli, Marcilei A.

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Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques von Chielle, Eduardo, Rosa, Felipe, Rodrigues, Gennaro S., Tambara, Lucas A., Tonfat, Jorge, Macchione, Eduardo, Aguirre, Fernando, Added, Nemitala, Medina, Nilberto, Aguiar, Vitor, Silveira, Marcilei A. G., Ost, Luciano, Reis, Ricardo, Cuenca-Asensi, Sergio, Kastensmidt, Fernanda L.

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Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy von Gonzalez, Carlos J., Added, Nemitala, Macchione, Eduardo L. A., Aguiar, Vitor A. P., Kastensmidt, Fernanda G. L., Puchner, Helmut K., Guazzelli, Marcilei A., Medina, Nilberto H., Balen, Tiago R.

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Analyzing Reliability and Performance Trade-Offs of HLS-Based Designs in SRAM-Based FPGAs Under Soft Errors von Antunes Tambara, Lucas, Tonfat, Jorge, Santos, Andre, Lima Kastensmidt, Fernanda, Medina, Nilberto H., Added, Nemitala, Aguiar, Vitor A. P., Aguirre, Fernando, Silveira, Marcilei A. G.

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Reliability-Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs von Antunes Tambara, Lucas, Kastensmidt, Fernanda Lima, Rech, Paolo, Lins, Filipe, Medina, Nilberto H., Added, Nemitala, Aguiar, Vitor A. P., Silveira, Marcilei A. G.

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Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems von Balen, Tiago R., González, Carlos J., Oliveira, Ingrid F. V., da Rosa Jr, Leomar S., Soares, Rafael I., Schvittz, Rafael B., Added, Nemitala, Macchione, Eduardo L. A., Aguiar, Vitor A. P., Guazzelli, Marcilei A., Medina, Nilberto H., Butzen, Paulo F.

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External-RBS, PIXE and NRA analysis for ancient swords von Santos, Hellen C., Added, Nemitala, Silva, Tiago F., Rodrigues, C.L.

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Determination of stable isotope ratios using nuclear reaction analysis coupled with a particle-gamma coincidence method von Allegro, Paula Rangel Pestana, Rizzutto, Márcia de Almeida, Added, Nemitala, Aguiar, Vitor Ângelo Paulino de, Toufen, Dennis Lozano, Macchione, Eduardo Luiz Augusto, Medina, Nilberto Heder, Ribas, Roberto Vicençotto, Oliveira, José Roberto Brandão de, Escudeiro, Rafael, Alcántara-Núñez, Juan Antonio, Curado, Jessica Fleury, Scarduelli, Valdir Brunetti, Zagatto, Vinicius Antonio Bocaline, Rodrigues, Cléber Lima, Tabacniks, Manfredo Harri

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Automatic energy calibration algorithm for an RBS setup von Silva, Tiago F., Moro, Marcos V., Added, Nemitala, Rizzutto, Marcia A., Tabacniks, Manfredo H.

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High sensitivity boron quantification in bulk silicon using the {sup 11}B(p,{alpha}{sub 0}){sup 8}Be nuclear reaction von Moro, Marcos V., Silva, Tiago F. da, Added, Nemitala, Rizutto, Marcia A., Tabacniks, Manfredo H., Neira, John B., Neto, Joao B. F.

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A PIXE Study of Trace Elements in Sediments of Toledo River, Parana, Brazil von Santos, Hellen C, Rizzutto, Marcia, Added, Nemitala, Espinoza-Quinones, Fernando

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Half Life of (101)Mo and (101)T(c) beta -decay von Genezini, Frederico A, Zahn, Guilherme S, Zamboni, Cibele B

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