Focused Ion Beam Micro- and Nanoengineering von Langford, Richard M., Nellen, Philipp M., Gierak, Jacques, Fu, Yongqi

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FIB-milling of photonic structures and sputtering simulation von Nellen, Philipp M., Callegari, Victor, Brönnimann, Rolf

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Spontaneous growth of uniformly distributed In nanodots and InI3 nanowires on InP induced by a focused ion beam von Callegari, Victor, Nellen, Philipp M.

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Milling micro-structures using focused ion beams and its application to photonic components von Nellen, Philipp M, Brönnimann, Rolf

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Fabrication and electrical characterization of circuits based on individual tin oxide nanowires von Hernández-Ramírez, Francisco, Tarancón, Albert, Casals, Olga, Rodríguez, Jordi, Romano-Rodríguez, Albert, Morante, Joan R, Barth, Sven, Mathur, Sanjay, Choi, Tae Y, Poulikakos, Dimos, Callegari, Victor, Nellen, Philipp M

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Surface chemistry and optimization of focused ion beam iodine-enhanced etching of indium phosphide von Callegari, Victor, Nellen, Philipp M., Yang, Tianhe, Hauert, Roland, Müller, Ulrich, Hernández-Ramírez, Francisco, Sennhauser, Urs

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Modeling and identification of an electro-mechanical system: The LISA grabbing positioning and release mechanism case von Bortoluzzi, Daniele, Mäusli, Pierre A., Antonello, Riccardo, Nellen, Philipp M.

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Application and reliability of a fiber optical surveillance system for a stay cable bridge von Brönnimann, Rolf, Nellen, Philipp M, Sennhauser, Urs

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Ion beam degradation analysis of poly(3-hexylthiophene) (P3HT): can cryo-FIB minimize irradiation damage? von SEZEN, Meltem, PLANK, Harald, NELLEN, Philipp M, MEIER, Stephan, CHERNEV, Boril, GROGGER, Werner, FISSLTHALER, Evelin, LIST, Emil J. W, SCHERF, Ullrich, POELT, Peter

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Focused ion beam modifications of indium phosphide photonic crystals von Nellen, Philipp M., Strasser, Patric, Callegari, Victor, Wüest, Robert, Erni, Daniel, Robin, Franck

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Long-term monitoring of polarization-mode dispersion of aerial optical cables with respect to line availability von Nellen, P.M., Bronnimann, R., Held, M., Sennhauser, U.

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Preparative Methods for Nanoanalysis of Materials with Focused Ion Beam Instruments von Nellen, Philipp M., Callegari, Victor, Sennhauser, Urs

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Micromachining by Focused Ion Beam (FIB) for Materials Characterization von Jud, P. P., Nellen, P. M., Sennhauser, U.

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Spontaneous growth of uniformly distributed In nanodots and InI 3 nanowires on InP induced by a focused ion beam von Callegari, Victor, Nellen, Philipp M.

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Fabrication and Modification of Photonic Structures with Focused Ion Beam von Callegari, Victor, Nellen, Philipp M., Brönnimann, Rolf, Nanzer, Thomas, Sennhauser, Urs

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Erratum to: “FIB-milling of photonic structures and sputtering simulation” [Microelectron. Eng. 83 (2006) 1805–1808] von Nellen, Philipp M., Callegari, Victor, Brönnimann, Rolf

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Focused ion beam mjicro-and nanoengineering : Focused ion beam microscopy and micromachining von LANGFORD, Richard M, NELLEN, Philipp M, GIERAK, Jacques, YONGQI FU

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Focused ion beam induced synthesis of a porous antimony nanowire network von Schoendorfer, Christoph, Lugstein, Alois, Hyun, Youn-Joo, Bertagnolli, Emmerich, Bischoff, Lothar, Nellen, Philipp M., Callegari, Victor, Pongratz, Peter

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Fabrication and electrical characterization of circuits based on individual tin oxide nanowires Francisco Hernandez-Ramirez, Albert Tarancon, Olga Casals, Jordi Rodriguez, Albert R... von Hernandez-Ramirez, Francisco, Tarancon, Albert, Casals, Olga, Rodriguez, Jordi, Romano-Rodriguez, Albert, Morante, Joan R, Barth, Sven, Mathur, Sanjay, Choi, Tae Y, Poulikakos, Dimos, Callegari, Victor, Nellen, Philipp M

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