Risks Associated With Primary and Redo Carotid Endarterectomy in the Endovascular Era von Arhuidese, I.J., Faateh, M., Nejim, B.J., Locham, S., Abularrage, C.J., Malas, M.B.

Volltext

The study of lattice damage using slow positrons following low energy B + implantation of silicon von Gwilliam, R.M, Knights, A.P, Nejim, A, Sealy, B.J, Burrows, C.P, Malik, F, Coleman, P.G

Volltext

Visible photoluminescence at room temperature from microcrystalline silicon precipitates in SiO2 formed by ion implantation von Komoda, T., Kelly, J., Cristiano, F., Nejim, A., Hemment, P.L.F., Homewood, K.P., Gwilliam, R., Mynard, J.E., Sealy, B.J.

Volltext

Ion beam analysis of 6H SiC implanted with erbium and ytterbium ions von Kozanecki, A., Jeynes, C., Sealy, B.J., Nejim, A.

Volltext

Evolution of mechanical strain and extended defects in annealed (1 0 0) silicon samples implanted with Ge + ions von Suprun-Belevich, Yu, Cristiano, F., Nejim, A., Hemment, P.L.F., Sealy, B.J.

Volltext

Residual post anneal damage of Ge and C co-implantation of Si determined by quantitative RBS-channelling von Nejim, A, Barradas, N.P, Jeynes, C, Cristiano, F, Wendler, E, Gärtner, K, Sealy, B.J

Volltext

Visible photoluminescence at room temperature from microcrystalline silicon precipitates in SiO 2 formed by ion implantation von Komoda, T., Kelly, J., Cristiano, F., Nejim, A., Hemment, P.L.F., Homewood, K.P., Gwilliam, R., Mynard, J.E., Sealy, B.J.

Volltext