Eighteenth-Century Meissen Porcelain Reference Data Obtained By Proton-Beam Analysis (PIXE-PIGE) von Neelmeijer, C., Pietsch, U., Ulbricht, H.

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High resolution Rutherford Backscattering Spectrometry investigations of ZrO2 layer growth in the initial stage on native silicon oxide and titanium nitride von Vieluf, M., Munnik, F., Neelmeijer, C., Kosmata, M., Teichert, S.

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Proton beam examination of glass – an analytical contribution for preventive conservation von Mäder, M., Neelmeijer, C.

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The merits of particle induced X-ray emission in revealing painting techniques von Neelmeijer, C., Mäder, M.

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Reverse painting on glass as seen by the proton beam von Neelmeijer, C., Mäder, M.

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The potential of external IBA and LA-ICP-MS for obsidian elemental characterization von Bugoi, R., Constantinescu, B., Neelmeijer, C., Constantin, F.

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IBA of iridescent Art Nouveau glass – comparative studies von Mäder, M., Jembrih-Simbürger, D., Neelmeijer, C., Schreiner, Manfred

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Investigations of Byzantine glass bracelets from Nufăru, Romania using external PIXE–PIGE methods von Bugoi, R., Poll, I., Mănucu-Adameşteanu, Gh, Neelmeijer, C., Eder, F.

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PIXE-RBS survey of a Meissen porcelain snuff box: first version or not? von Neelmeijer, C., Roscher, R.

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The colour of silver stained glass—analytical investigations carried out with XRF, SEM/EDX, TEM, and IBA von Jembrih-Simbürger, D., Neelmeijer, C., Schalm, O., Fredrickx, P., Schreiner, M., De Vis, K., Mäder, M., Schryvers, D., Caen, J.

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X-ray fluorescence and ion beam analysis of iridescent Art Nouveau glass – authenticity and technology von Jembrih-Simbürger, D., Neelmeijer, C., Mäder, M., Schreiner, M.

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Eighteenth‐Century M eissen Porcelain Reference Data Obtained By Proton‐Beam Analysis ( PIXE–PIGE ) von Neelmeijer, C., Pietsch, U., Ulbricht, H.

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Depth resolved ion beam analysis of objects of art von Neelmeijer, C., Wagner, W., Schramm, H.P.

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Iridescent Art Nouveau glass – IBA and XPS for the characterisation of thin iridescent layers von Jembrih, D, Neelmeijer, C, Schreiner, M, Mäder, M, Ebel, M, Svagera, R, Peev, M

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Non-destructive evaluation of glass corrosion states von Mäder, M., Grambole, D., Herrmann, F., Neelmeijer, C., Schreiner, M., Woisetschläger, G.

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A simple paper-based secondary standard for energy dispersive X-ray analysis von Neelmeijer, C., Hüller, J., Mäder, M., Borchers, B., Jarjis, R.A.

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Initial inter-laboratory testing of the Rossendorf-Oxford (ROX97) secondary standard for X-ray analysis von Neelmeijer, C., Mäder, M., Jarjis, R., Calligaro, T., Salomon, J., Schreiner, M., Gantz, T.

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External proton beam analysis of layered objects von WAGNER, W, NEELMEIJER, C

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Hydrogen analysis in CrSiO thin films von NEELMEIJER, C, SOBE, G

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“De re metallica” (G. Agricola) — IBA on air von Neelmeijer, C., Wagner, W., Schramm, H.P., Thiel, U.

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