Incorporating Component-Level Testing into Bayesian Degradation Distributions to Estimate a Voltage Regulator's Radiation Failure Probabilities von Nederlander, Richard H., Witulski, Arthur F., Reed, Robert A., Karsai, Gabor, Ladbury, Ray L., Zhang, En Xia, Schrimpf, Ronald D., Ryder, Kaitlyn L., Campola, Michael J., Mahadevan, Nag, Austin, Rebekah A., Sierawski, Brian D.

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