Use of optical spacers to enhance infrared Mueller ellipsometry sensitivity: application to the characterization of organic thin films von Ndong, Gerald, Lizana, Angel, Garcia-Caurel, Enric, Paret, Valerie, Melizzi, Géraldine, Cattelan, Denis, Pelissier, Bernard, Tortai, Jean-Hervé

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Raman spectroscopy and polarization: Selected case studies von Ossikovski, Razvigor, Picardi, Gennaro, Ndong, Gérald, Chaigneau, Marc

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(Invited) Strain Engineering for Optical Gain in Germanium von El Kurdi, Moustafa, de Kersauson, Malo, Ghrib, Abdelhamid, Prost, M., Sauvage, Sébastien, Jakomin, Roberto, Beaudoin, Grégoire, Mauguin, Olivia, Largeau, Ludovic, Sagnes, Isabelle, Ndong, Gerald, Chaigneau, Marc, Ossikovski, Razvigor, Boucaud, Philippe

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Retardation assisted enhanced Raman scattering from silicon nanostripes in the visible range von Ndong, G, Picardi, G, Chaigneau, M, Ossikovski, R

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Raman spectroscopy and polarization: Selected case studies: Nanophotonics and near field von OSSIKOVSKI, Razvigor, PICARDI, Gennaro, NDONG, Gérald, CHAIGNEAU, Marc

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Strain Engineering for Optical Gain in Germanium von Boucaud, Philippe, El Kurdi, Moustafa, De Kersauson, Malo, Ghrib, Abdelhamid, Sauvage, Sébastien, Jakomin, Roberto, Beaudoin, Grégoire, Mauguin, Olivia, Largeau, Ludovic, Sagnes, Isabelle, Ndong, Gerald, Chaigneau, Marc, Ossikovski, Razvigor

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