GENERATING A REDUCED BLOCK MODEL VIEW ON-THE-FLY von GHOSH, Soumen, VARKEY, Vijaya V, NARWADE, Mahantesh D, SINGLA, Abhinav, MUKHERJEE, Rajarshi, ROIZMAN, Mark

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GENERATING A REDUCED BLOCK MODEL VIEW ON-THE-FLY von Narwade, Mahantesh D, Singla, Abhinav, Varkey, Vijaya V, Ghosh, Soumen, Mukherjee, Rajarshi, Roizman, Mark

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GENERATING A REDUCED BLOCK MODEL VIEW ON-THE-FLY von GHOSH, Soumen, VARKEY, Vijaya V, NARWADE, Mahantesh D, SINGLA, Abhinav, MUKHERJEE, Rajarshi, ROIZMAN, Mark

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Clock-domain-crossing specific design mutations to model silicon behavior and measure verification robustness von Narwade, Mahantesh D, Forey, Jean-Marc A, Toma, Horia A, Gupta, Namit K

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Accurate glitch detection von De Kaushik, Senapati Dipti Ranjan, Gupta Namit K, Narwade Mahantesh D, Mukherjee Rajarshi

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ACCURATE GLITCH DETECTION von De Kaushik, Senapati Dipti Ranjan, Gupta Namit K, Narwade Mahantesh D, Mukherjee Rajarshi

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CLOCK-DOMAIN-CROSSING SPECIFIC DESIGN MUTATIONS TO MODEL SILICON BEHAVIOR AND MEASURE VERIFICATION ROBUSTNESS von Gupta Namit K, Narwade Mahantesh D, Forey Jean-Marc A, Toma Horia A

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Functional Verification of a Circuit Description von MUKHERJEE RAJARSHI, DE KAUSHIK, NARWADE MAHANTESH, GUPTA NAMIT

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VERIFICATION OF CIRCUIT STRUCTURES INCLUDING SUB-STRUCTURE VARIANTS von NANDAN SUMAN, MUKHERJEE RAJARSHI, DE KAUSHIK, PAL SUBHAMOY, NARWADE MAHANTESH, GUPTA NAMIT

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Method for circuit design pattern recognition in a circuit description, system and computer program product von DE, KAUSHIK, NANDAN, SUMAN, PAL, SUBHAMOY, MUKHERJEE, RAJARSHI, GUPTA, NAMIT, NARWADE, MAHANTESH

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Ranking verification results for root cause analysis von HARER KEVIN M, MUKHERJEE RAJARSHI, DE KAUSHIK, NARWADE MAHANTESH

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Method and system for functional verification of a circuit description von GUPTA, NAMIT KUMAR, DE, KAUSHIK, NARWADE, MAHANTESH DEVAPPA, MUKHERJEE, RAJARSHI

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RANKING VERIFICATION RESULTS FOR ROOT CAUSE ANALYSIS von HARER KEVIN M, MUKHERJEE RAJARSHI, DE KAUSHIK, NARWADE MAHANTESH

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