Expected values and variances of Bragg peak intensities measured in a nanocrystalline powder diffraction experiment von Öztürk, Hande, Noyan, I. Cevdet

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Correlating sampling and intensity statistics in nanoparticle diffraction experiments von Öztürk, Hande, Yan, Hanfei, Hill, John P., Noyan, I. Cevdet

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Sampling volumes in powder diffraction experiments von Noyan, M. Alican, Noyan, I. Cevdet

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First-principles diffraction simulations as a tool to solve the nanodiffraction problem von Öztürk, Hande, Noyan, I. Cevdet

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Applied and Residual Stress Determination Using X-ray Diffraction von Murray, Conal E, Cevdet Noyan, I

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Correlating sampling and intensity statistics in nanoparticle diffraction experiments von Öztürk, Hande, Yan, Hanfei, Hill, John P., Noyan, I. Cevdet

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Characterization of Fiber/Matrix Interfaces Using X-Ray Microtopography von Aydiner, Cahit Can, Kaldor, Steffen K., Cevdet Noyan, I., Üstündag, Ersan, Swift, Geoffrey A., Hanan, Jay.C.

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Coherency effects in nanobeam x-ray diffraction analysis von Yan, Hanfei, Kalenci, Özgür, Noyan, I. Cevdet, Maser, Jörg

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The physical design of on-chip interconnections von Wisniewski, M.Y.L., Yashchin, E., Franch, R.L., Conrady, D.P., Maynard, D.N., Fiorenza, G., Noyan, I.C.

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Method for improving the morphology of refactory metal thin films von ALLEN, RUSSELL D, YURKAS, JOHN J, NOYAN, CEVDET I, MCFEELY, F. READ

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Ultra thin, single phase, diffusion barrier for metal conductors von YURKAS, JOHN J., RODBELL, KENNETH P, NOYAN, CEVDET I, MCFEELY, FENTON R, COHEN, STEPHAN A

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Method for improving the morphology of refractory metal thin films von YURKAS, JOHN J, MCFEELY, F. READ, NOYAN, CEVDET I, ALLEN, RUSSELL D

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Ultra thin, single phase, diffusion barrier for metal conductors von MCFEELY FENTON R, RODBELL KENNETH P, NOYAN CEVDET I, COHEN STEPHAN A, ROSENBERG ROBERT, YURKAS JOHN J

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Diffusion barrier for metal conductors von COHEN, STEPHEN A, RODBELL, KENNETH P, YURKAS, JOHN J, NOYAN, CEVDET I, MCFEELY, FENTON R, ROSENBURG, ROBERT

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ULTRA THIN, SINGLE PHASE, DIFFUSION BARRIER FOR METAL CONDUCTORS von RODBELL KENNETH P, MCFEELY FENTON READ, NOYAN CEVDET I, COHEN STEPHEN A, ROSENBURG ROBERT, YURKAS JOHN J

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ULTRATHIN SINGLE PHASE BARRIER LAYER FOR CONDUCTOR AND ITS MANUFACTURING METHOD von MCFEELY FENTON R, RODBELL KENNETH P, NOYAN CEVDET I, COHEN STEPHEN A, ROSENBERG ROBERT, YURKAS JOHN J

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Diffusion barrier for metal conductors von COHEN, STEPHEN A, RODBELL, KENNETH P, YURKAS, JOHN J, NOYAN, CEVDET I, MCFEELY, FENTON R, ROSENBURG, ROBERT

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Lower uncertainty bounds of diffraction‐based nanoparticle sizes von Noyan, İsmail Cevdet, Öztürk, Hande

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Kinematic scattering by nanocrystals von Thomas, Olivier, Noyan, Ismail Cevdet

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