Introduction and comparison of new EBSD post-processing methodologies von Wright, Stuart I., Nowell, Matthew M., Lindeman, Scott P., Camus, Patrick P., De Graef, Marc, Jackson, Michael A.

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Parent Grain Reconstruction in an Additive Manufactured Titanium Alloy von Wright, Stuart I., Lenthe, William C., Nowell, Matthew M.

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Orientation effects on indexing of electron backscatter diffraction patterns von Nowell, Matthew M., Wright, Stuart I.

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In Situ EBSD Observations of the Evolution in Crystallographic Orientation with Deformation von Wright, Stuart I., Suzuki, Seiichi, Nowell, Matthew M.

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A multiscale comparison of stochastic open-cell aluminum foam produced via conventional and additive-manufacturing routes von Matheson, Kristoffer E., Cross, Kory K., Nowell, Matthew M., Spear, Ashley D.

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Electron imaging with an EBSD detector von Wright, Stuart I., Nowell, Matthew M., de Kloe, René, Camus, Patrick, Rampton, Travis

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Surface studies of niobium chemically polished under conditions for superconducting radio frequency (SRF) cavity production von Tian, Hui, Reece, Charles E., Kelley, Michael J., Wang, Shancai, Plucinski, Lukasz, Smith, Kevin E., Nowell, Matthew M.

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Reconstructed and analyzed X-ray computed tomography data of investment-cast and additive-manufactured aluminum foam for visualizing ligament failure mechanisms and regions of cont... von Matheson, Kristoffer E., Cross, Kory K., Nowell, Matthew M., Spear, Ashley D.

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Orientation Precision of Electron Backscatter Diffraction Measurements Near Grain Boundaries von Wright, Stuart I., Nowell, Matthew M., de Kloe, René, Chan, Lisa

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Five-Parameter Grain Boundary Inclination Recovery with EBSD and Interaction Volume Models von Sorensen, Caroline, Basinger, John A., Nowell, Matthew M., Fullwood, David T.

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Characterization of Sputtered CdTe Thin Films with Electron Backscatter Diffraction and Correlation with Device Performance von Nowell, Matthew M., Scarpulla, Michael A., Paudel, Naba R., Wieland, Kristopher A., Compaan, Alvin D., Liu, Xiangxin

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A comparison of textures measured using X-ray and electron backscatter diffraction von WRIGHT, Stuart I, NOWELL, Matthew M, BINGERT, John F

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Improved EBSD Map Fidelity through Re-indexing of Neighbor Averaged Patterns von Wright, Stuart I., Nowell, Matthew M., Lindeman, Scott P., Camus, Patrick

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A New Microstructural Imaging Approach through EBSD Pattern Region of Interest Analysis von Nowell, Matthew M., Wright, Stuart I., Rampton, Travis, de Kloe, René

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New Tools for the Study of Deformed and Heat-Treated Materials via Electron Backscatter Diffraction von Rampton, Travis M., Nowell, Matthew M., Wright, Stuart I.

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Impact of Local Texture on Recrystallization and Grain Growth via In Situ EBSD von Field, David P., Nowell, Matthew M., Wright, Stuart I.

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Advances in Scattered Electron Intensity Distribution Imaging for Microstructural Visualization and Correlations with EBSD Measurements von Nowell, Matthew M., Wright, Stuart I., Rampton, Travis, de Kloe, René

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New Technology and Approaches for the Acceleration and Enhancement of Microstructural Characterization using Electron Backscatter Diffraction von Nowell, Matthew M., Wright, Stuart I., Rampton, Travis, Stromberg, Ryan J., Bhowmich, Sanjit, Shibata, Masateru, Erdman, Natasha

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Electron Backscatter Diffraction Analysis of Beam Sensitive Samples Using Direct Detection Technology von Nowell, Matthew M, de Kloe, René

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Thoughts on Standards Materials and Analytical Routines for Electron Backscatter Diffraction (EBSD) von Nowell, Matthew M., Wright, Stuart I.

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