Subsurface damage from helium ions as a function of dose, beam energy, and dose rate von Livengood, Richard, Tan, Shida, Greenzweig, Yuval, Notte, John, McVey, Shawn

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Advances in source technology for focused ion beam instruments von Smith, Noel S., Notte, John A., Steele, Adam V.

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The history and development of the helium ion microscope von Economou, Nicholas P., Notte, John A., Thompson, William B.

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Neon Ion Beam Lithography (NIBL) von Winston, Donald, Manfrinato, Vitor R, Nicaise, Samuel M, Cheong, Lin Lee, Duan, Huigao, Ferranti, David, Marshman, Jeff, McVey, Shawn, Stern, Lewis, Notte, John, Berggren, Karl K

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The Prospects of a Subnanometer Focused Neon Ion Beam von Rahman, F. H. M., McVey, Shawn, Farkas, Louis, Notte, John A., Tan, Shida, Livengood, Richard H.

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Gas field ion source and liquid metal ion source charged particle material interaction study for semiconductor nanomachining applications von Tan, Shida, Livengood, Richard, Shima, Darryl, Notte, John, McVey, Shawn

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Observation of synchronized atomic motions in the field ion microscope von Rahman, FHM F., Notte, John A., Livengood, Richard H., Tan, Shida

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Nano‐Kirigami Structures and Branched Nanowires Fabricated by Focused Ion Beam‐Induced Milling, Bending, and Deposition von Xia, Deying, Notte, John

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Focused Ion Beams for Imaging, Analysis, and Fabrication - Where Did They Come From and Where are They Going? von Notte, John

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The neon gas field ion source—a first characterization of neon nanomachining properties von Livengood, Richard H., Tan, Shida, Hallstein, Roy, Notte, John, McVey, Shawn, Faridur Rahman, F.H.M.

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Nano‐Kirigami Structures and Branched Nanowires Fabricated by Focused Ion Beam‐Induced Milling, Bending, and Deposition (Adv. Mater. Interfaces 28/2022) von Xia, Deying, Notte, John

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Analysis of subsurface beam spread and its impact on the image resolution of the helium ion microscope von Sijbrandij, Sybren, Notte, John, Sanford, Colin, Hill, Ray

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Light Ion Beams Interacting with Thin Films von Xia, Deying, Notte, John

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GaAs milling with neon focused ion beam: Comparison with gallium focused ion beam milling and subsurface damage analysis von Xia, Deying, Jiang, Ying-Bing, Notte, John, Runt, Doug

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Helium Ion Secondary Electron Mode Microscopy For Interconnect Material Imaging von Ogawa, Shinichi, Thompson, William, Stern, Lewis, Scipioni, Larry, Notte, John, Farkas, Lou, Barriss, Louise

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An Introduction to the Helium Ion Microscope von Notte, John, Ward, Bill, Economou, Nick, Hill, Ray, Percival, Randy, Farkas, Lou, McVey, Shawn

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Camera for transmission He+ ion microscopy von Kavanagh, Karen L., Herrmann, Christoph, Notte, John A.

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ZEISS Orion NanoFab New Features: “Shuttle and Find” and Automation von Morin, Anthony, Notte, John, Runt, Doug

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NanoFab with SIMS - Recent Results from the BAM-L200 Analytical Standard and Semiconductor Samples von Lewis, Brett, Khanom, Fouzia, Notte, John

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Enhancement of XeF2-assisted gallium ion beam etching of silicon layer and endpoint detection from backside in circuit editing von Xia, Deying, Notte, John, Stern, Lewis, Goetze, Bernhard

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