World's first monolithic 3D-FPGA with TFT SRAM over 90nm 9 layer Cu CMOS von Naito, T, Ishida, T, Onoduka, T, Nishigoori, M, Nakayama, T, Ueno, Y, Ishimoto, Y, Suzuki, A, Chung, W, Madurawe, R, Wu, S, Ikeda, S, Oyamatsu, H

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The prognostic impact of uric acid in patients with severely decompensated acute heart failure von Okazaki, Hirotake, MD, PhD, Shirakabe, Akihiro, MD, PhD, Kobayashi, Nobuaki, MD, PhD, Hata, Noritake, MD, PhD, Shinada, Takuro, MD, PhD, Matsushita, Masato, MD, Yamamoto, Yoshiya, MD, Shibuya, Junsuke, MD, Shiomura, Reiko, MD, Nishigoori, Suguru, MD, Asai, Kuniya, MD, PhD, Shimizu, Wataru, MD, PhD, FJCC

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The prognostic impact of gender in patients with acute heart failure – An evaluation of the age of female patients with severely decompensated acute heart failure von Nozaki, Ayaka, MD, Shirakabe, Akihiro, MD, PhD, Hata, Noritake, MD, PhD, Kobayashi, Nobuaki, MD, PhD, Okazaki, Hirotake, MD, PhD, Matsushita, Masato, MD, Shibata, Yusaku, MD, Nishigoori, Suguru, MD, Uchiyama, Saori, MD, Kusama, Yoshiki, MD, PhD, FJCC, Asai, Kuniya, MD, PhD, Shimizu, Wataru, MD, FJCC

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Response to letter regarding article, “The prognostic impact of uric acid in patients with severely decompensated acute heart failure” von Okazaki, Hirotake, MD, PhD, Shirakabe, Akihiro, MD, PhD, Otsuka, Toshiaki, MD, PhD, Kobayashi, Nobuaki, MD, PhD, Hata, Noritake, MD, PhD, Shinada, Takuro, MD, PhD, Matsushita, Masato, MD, Yamamoto, Yoshiya, MD, Shibuya, Junsuke, MD, Shiomura, Reiko, MD, Nishigoori, Suguru, MD, Asai, Kuniya, MD, PhD, Shimizu, Wataru, MD, PhD, FJCC

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A cost-conscious 32nm CMOS platform technology with advanced single exposure lithography and gate-first metal gate/high-k process von Hasegawa, S., Kitamura, Y., Takahata, K., Okamoto, H., Hirai, T., Miyashita, K., Ishida, T., Aizawa, H., Aota, S., Azuma, A., Fukushima, T., Harakawa, H., Hasegawa, E., Inohara, M., Inumiya, S., Ishizuka, T., Iwamoto, T., Kariya, N., Kojima, K., Komukai, T., Matsunaga, N., Mimotogi, S., Muramatsu, S., Nagatomo, K., Nagahara, S., Nakahara, Y., Nakajima, K., Nakatsuka, K., Nishigoori, M., Nomachi, A., Ogawa, R., Okada, N., Okamoto, S., Okano, K., Oki, T., Onoda, H., Sasaki, T., Satake, M., Suzuki, T., Suzuki, Y., Tagami, M., Takeda, K., Tanaka, M., Taniguchi, K., Tominaga, M., Tsutsui, G., Utsumi, K., Watanabe, S., Watanabe, T., Yoshimizu, Y., Kitano, T., Naruse, H., Goto, Y., Nakayama, T., Nakamura, N., Matsuoka, F.

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65nm CMOS technology (CMOS5) with high density embedded memories for broadband microprocessor applications von YANAGIYA, N, MATSUDA, S, MATSUBARA, Y, HABU, M, NISHIGOORI, M, HONDA, K, TSUNO, H, YASUMOTO, K, YAMAMOTO, T, HIYAMA, K, KOKUBUN, K, SUZUKI, T, INABA, S, YOSHIKAWA, J, SAKURAI, T, ISHIZUKA, T, SHODA, Y, MORIUCHI, M, KISHIDA, M, MATSUMORI, H, HARAKAWA, H, OYAMATSU, H, NAGASHIMA, N, TAKAYANAGI, M, YAMADA, S, NOGUCHI, T, OKAMOTO, H, KAKUMU, M, MIZUSHIMA, I, OHUCHI, K, OKANO, K, TAKAHASI, K, MORIFUJI, E, KANDA, M

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Highly stable 65 nm node (CMOS5) 0.56 /spl mu/m/sup 2/ SRAM cell design for very low operation voltage von Kanda, M., Morifuji, E., Nishigoori, M., Fujimoto, Y., Uematsu, M., Takahashi, K., Tsuno, H., Okano, K., Matsuda, S., Oyamatsu, H., Takahashi, H., Nagashima, N., Yamada, S., Noguchi, T., Okamoto, Y., Kakumu, M.

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65 nm CMOS technology (CMOS5) with high density embedded memories for broadband microprocessor applications von Yanagiya, N., Matsuda, S., Inaba, S., Takayanagi, M., Mizushima, I., Ohuchi, K., Okano, K., Takahasi, K., Morifuji, E., Kanda, M., Matsubara, Y., Habu, M., Nishigoori, M., Honda, K., Tsuno, H., Yasumoto, K., Yamamoto, T., Hiyama, K., Kokubun, K., Suzuki, T., Yoshikawa, J., Sakurai, T., Ishizuka, T., Shoda, Y., Moriuchi, M., Kishida, M., Matsumori, H., Harakawa, H., Oyamatsu, H., Nagashima, N., Yamada, S., Noguchi, T., Okamoto, H., Kakumu, M.

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LIF diagnostics of C2 radical behaviour in a laser CVD environment von Okada, T., Nishigoori, T., Kajiyama, Y., Maeda, M.

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