On groups of central type, non-degenerate and bijective cohomology classes von David, Nir Ben, Ginosar, Yuval

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On groups of I-type and involutive Yang–Baxter groups von Ben David, Nir, Ginosar, Yuval

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Isotropy in group cohomology von Ben David, Nir, Ginosar, Yuval, Meir, Ehud

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Isotropy in Group Cohomology von Nir Ben David, Ginosar, Yuval, Meir, Ehud

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CALIBRATED MEASUREMENT OF OVERLAY ERROR USING SMALL TARGETS von GHINOVKER, Mark, FELER, Yoel, BEN DAVID, Nir, UZIEL, Yoram

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작은 타겟을 사용하는 오버레이 에러의 교정된 측정 von GHINOVKER MARK, UZIEL YORAM, FELER YOEL, BEN DAVID NIR

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On groups of \(I\)-type and involutive Yang-Baxter groups von Nir Ben David, Ginosar, Yuval

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Systems and methods for improved metrology for semiconductor device wafers von Simon, Yossi, Negri, Daria, Ben David, Nir, Bachar, Ohad, Manassen, Amnon, Uziel, Yoram, Lavert, Etay, Yerushalmi, Liran

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System, a method and a computer program product for size estimation von Dodzin, Nir Ben-David, Amzaleg, Moshe

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SYSTEMS AND METHODS FOR ROTATIONAL CALIBRATION OF METROLOGY TOOLS von NOVIKOV, Alexander, FELER, Yoel, BEN DAVID, Nir, UZIEL, Yoram, DOLEV, Ido, PASKOVER, Yuri, MANASSEN, Amnon

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SYSTEMS AND METHODS FOR ROTATIONAL CALIBRATION OF METROLOGY TOOLS von Paskover, Yuri, Ben David, Nir, Manassen, Amnon, Feler, Yoel, Novikov, Alexander, Uziel, Yoram, Dolev, Ido

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반도체 디바이스 웨이퍼에 대한 향상된 계측을 위한 시스템 및 방법 von YERUSHALMI LIRAN, UZIEL YORAM, SIMON YOSSI, MANASSEN AMNON, NEGRI DARIA, BACHAR OHAD, LAVERT ETAY, BEN DAVID NIR

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SYSTEMS AND METHODS FOR IMPROVED METROLOGY FOR SEMICONDUCTOR DEVICE WAFERS von BACHAR, Ohad, BEN DAVID, Nir, UZIEL, Yoram, NEGRI, Daria, LAVERT, Etay, SIMON, Yossi, MANASSEN, Amnon, YERUSHALMI, Liran

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SYSTEMS AND METHODS FOR IMPROVED METROLOGY FOR SEMICONDUCTOR DEVICE WAFERS von Simon, Yossi, Negri, Daria, Ben David, Nir, Bachar, Ohad, Manassen, Amnon, Uziel, Yoram, Lavert, Etay, Yerushalmi, Liran

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반복적인 실험 및 피드백에 기초한 동적 레시피로 샘플을 분석하기 위한 시스템 및 방법 von GOLOTSVAN ANNA, VOLKOVICH ROIE, YAZIV TAL, BEN DAVID NIR, MILO RENAN

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On groups of $I$-type and involutive Yang-Baxter groups von David, Nir Ben, Ginosar, Yuval

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SYSTEM AND METHOD FOR ANALYZING A SAMPLE WITH A DYNAMIC RECIPE BASED ON ITERATIVE EXPERIMENTATION AND FEEDBACK von MILO, Renan, BEN DAVID, Nir, VOLKOVICH, Roie, YAZIV, Tal, GOLOTSVAN, Anna

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Calibration measurements for superposition errors using small targets von BEN-DAVID NIR, GENOUK, MIKHAIL, FELER YOEL, UZIEL YOHAN

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Inspection of a lithographic mask that is protected by a pellicle von Dodzin, Nir Ben-David, Litman, Alon, Karabekov, Albert, Goldenshtein, Alex

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ENHANCING PERFORMANCE OF OVERLAY METROLOGY von PASKOVER YURI, GOLOTSVAN ANNA, UZIEL YORAM, SIMON YOSSI, MANASSEN AMNON, LEVINSKI VLADIMIR, GUTMAN NADAV, HILL ANDREW V, YAACOV DROR, REDDY NIREEKSHAN K, NEGRI DARIA, ROTHMAN NACHSHON, VAKNIN YONATAN, BEN DAVID NIR, ABRAMOV AVI

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