Current state of standardization in the field of dimensional computed tomography von Bartscher, Markus, Sato, Osamu, Härtig, Frank, Neuschaefer-Rube, Ulrich

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Experimental investigation of surface determination process on multi-material components for dimensional computed tomography von Borges de Oliveira, Fabrício, Stolfi, Alessandro, Bartscher, Markus, De Chiffre, Leonardo, Neuschaefer-Rube, Ulrich

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Optical Methods for Dimensional Metrology in Production Engineering von Schwenke, Heinrich, Neuschaefer-Rube, Ulrich, Pfeifer, Tilo, Kunzmann, Horst

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ISO test survey on material influence in dimensional computed tomography von Bartscher, Markus, Illemann, Jens, Neuschaefer-Rube, Ulrich

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Overview of 3D Micro- and Nanocoordinate Metrology at PTB von Dai, Gaoliang, Neugebauer, Michael, Stein, Martin, Bütefisch, Sebastian, Neuschaefer-Rube, Ulrich

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The metrological structural resolution for dimensional x-ray CT: analysis of the comparability between the CEB and the PBS method von Laquai, René, Illemann, Jens, Bartscher, Markus, Neuschaefer-Rube, Ulrich

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Validation of a fast and traceable radiographic scale calibration of dimensional computed tomography von Neuschaefer-Rube, Ulrich, Illemann, Jens, Sturm, Matthias, Bircher, Benjamin A, Meli, Felix, Bellon, Carsten, Evsevleev, Sergei

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On the importance of multi-material acceptance testing for CT-based CMSs von Borges de Oliveira, Fabrício, Bartscher, Markus, Neuschaefer-Rube, Ulrich, Hiller, Jochen, Tutsch, Rainer

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Methodologies for model parameterization of virtual CTs for measurement uncertainty estimation von Binder, Felix, Bircher, Benjamin A, Laquai, René, Küng, Alain, Bellon, Carsten, Meli, Felix, Deresch, Andreas, Neuschaefer-Rube, Ulrich, Hausotte, Tino

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Accurate particle speed prediction by improved particle speed measurement and 3-dimensional particle size and shape characterization technique von Cernuschi, Federico, Rothleitner, Christian, Clausen, Sønnik, Neuschaefer-Rube, Ulrich, Illemann, Jens, Lorenzoni, Lorenzo, Guardamagna, Cristina, Larsen, Henning Engelbrecht

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Procedure and reference standard to determine the structural resolution in coordinate metrology von Illemann, Jens, Bartscher, Markus, Jusko, Otto, Härtig, Frank, Neuschaefer-Rube, Ulrich, Wendt, Klaus

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Simultaneous measurement of surface geometry and material distribution by focusing ellipsotopometry von Neuschaefer-Rube, Ulrich, Holzapfel, Wolfgang

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Tactile and optical microsensors: test procedures and standards von Neuschaefer-Rube, Ulrich, Neugebauer, Michael, Ehrig, Wiebke, Bartscher, Markus, Hilpert, Uwe

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Ellipsometric determination of polarization-dependent transmission in resonant feedback systems von Holzapfel, Wolfgang, Neuschaefer-Rube, Ulrich, Braasch, Jan Christian, Mahdavi, Nejat

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Multi-material Acceptance Testing for CT-Based Coordinate Measurement Systems von Borges de Oliveira, Fabricio, Bartscher, Markus, Neuschaefer-Rube, Ulrich, Tutsch, Rainer, Hiller, Jochen

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Achieving Traceability of Industrial Computed Tomography von Neukamm, Marko, Bartscher, Markus, Kniel, Karin, Staude, Andreas, Goebbels, Jürgen, Neuschaefer-Rube, Ulrich, Härtig, Frank, Ehrig, Karsten, Hilpert, Uwe

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Rückführbare Koordinatenmesstechnik für Mikrobauteile: Grundlagen und Beispiele (Traceable Coordinate Metrology for Microparts: Basic Principles and Examples) von Härtig, Frank, Neuschaefer-Rube, Ulrich

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Neuere Entwicklungen von Normalen für die 3D-Mikro- und Nanometrologie von Neuschaefer-Rube, Ulrich, Neugebauer, Michael, Dziomba, Thorsten, Danzebrink, Hans-Ulrich, Koenders, Ludger, Bosse, Harald

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Dimensional Control of Micro Components with Synchrotron Computed Tomography von Ehrig, Karsten, Goebbels, Juergen, Staude, Andreas, Bartscher, Markus, Haertig, Frank, Kniel, Karin, Neukamm, Marko, Neuschaefer-Rube, Ulrich

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Dimensional Control of Micro Components with Synchrotron Computed Tomography von Ehrig, Karsten, Bartscher, Markus, Goebbels, Jurgen, Hartig, Frank, Kniel, Karin, Neukamm, Marko, Neuschaefer-Rube, Ulrich, Staude, Andreas

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