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  1. 1
    Enhanced control in scan tests of integrated circuits with partitioned scan chains

    Enhanced control in scan tests of integrated circuits with partitioned scan chains von TIWARI RAJESH K, HALES ALAN D, NAKIDI SRUJAN K, PAREKHJI RUBIN A, RAVI SRIVATHS

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  2. 2
    ENHANCED CONTROL IN SCAN TESTS OF INTEGRATED CIRCUITS WITH PARTITIONED SCAN CHAINS

    ENHANCED CONTROL IN SCAN TESTS OF INTEGRATED CIRCUITS WITH PARTITIONED SCAN CHAINS von NAKIDI, SRUJAN, K, RAVI, SRIVATHS, HALES, ALAN, D, PAREKHJI, RUBIN, A, TIWARI, RAJESH, K

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  3. 3
    ENHANCED CONTROL IN SCAN TESTS OF INTEGRATED CIRCUITS WITH PARTITIONED SCAN CHAINS

    ENHANCED CONTROL IN SCAN TESTS OF INTEGRATED CIRCUITS WITH PARTITIONED SCAN CHAINS von NAKIDI, SRUJAN, K, RAVI, SRIVATHS, HALES, ALAN, D, PAREKHJI, RUBIN, A, TIWARI, RAJESH, K

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  4. 4
    Enhanced control in scan tests of integrated circuits with partitioned scan chains

    Enhanced control in scan tests of integrated circuits with partitioned scan chains von TIWARI RAJESH K, HALES ALAN D, NAKIDI SRUJAN K, PAREKHJI RUBIN A, RAVI SRIVATHS

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