Determination of Phonon Deformation Potentials in Carbon-Doped Silicon von Yoshioka, Kazutoshi, Yokogawa, Ryo, Murakami, Tatsumi, Komago, Shota, Sawamoto, Naomi, Ogura, Atsushi

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Evaluation of Anisotropic Three-Dimensional Strain Relaxation in Stripe-Shaped Ge1-xSnx Mesa Structure von Takahashi, Yuki, Yokogawa, Ryo, Murakami, Tatsumi, Hirosawa, Ichiro, Suda, Kohei, Ogura, Atsushi

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Strain Evaluation of Laser-Annealed SiGe Thin Layers von Komago, Shota, Murakami, Tatsumi, Yoshioka, Kazutoshi, Yokogawa, Ryo, Borland, John O, Kuroi, Takashi, Tabata, Toshiyuki, Huet, Karim, Horiguchi, Naoto, Ogura, Atsushi

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Determination of phonon deformation potentials and strain-shift coefficients in Ge-rich Si1−xGex using bulk Ge-rich Si1−xGex crystals and oil-immersion Raman spectroscopy von Yokogawa, Ryo, Takeuchi, Kazuma, Murakami, Tatsumi, Usuda, Koji, Yonenaga, Ichiro, Ogura, Atsushi

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Determination of phonon deformation potentials and strain-shift coefficients in Ge-rich Si 1− x Ge x using bulk Ge-rich Si 1− x Ge x crystals and oil-immersion Raman spectroscopy... von Yokogawa, Ryo, Takeuchi, Kazuma, Murakami, Tatsumi, Usuda, Koji, Yonenaga, Ichiro, Ogura, Atsushi

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Determination of phonon deformation potentials and strain-shift coefficients in Ge-rich Si^sub 1− x^ Ge ^sub x^ using bulk Ge-rich Si^sub 1− x^ Ge ^sub x^ crystals and oil-immersio... von Yokogawa, Ryo, Takeuchi, Kazuma, Murakami, Tatsumi, Usuda, Koji, Yonenaga, Ichiro, Ogura, Atsushi

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Evaluation of Anisotropic Three-Dimensional Strain Relaxation in Stripe-Shaped Ge 1-x Sn x Mesa Structure von Takahashi, Yuki, Yokogawa, Ryo, Murakami, Tatsumi, Hirosawa, Ichiro, Suda, Kohei, Ogura, Atsushi

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Lattice strain evaluation by using indirect X-ray reflection von Miyashita, Haruka, Amagai, Saki, Akimoto, Koichi, Murakami, Tatsumi, Ogura, Atsushi

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Derivation of Phonon Deformation Potentials in Carbon-doped Silicon von Yoshioka, Kazutoshi, Murakami, Tatsumi, Komago, Shota, Yokogawa, Ryo, Sawamoto, Naomi, Ogura, Atsushi

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Evaluation of Anisotropic lattice parameters of Ge1-xSnx Mesa Structures by Reciprocal Space Mapping von Hirosawa, Ichiro, Murakami, Tatsumi, Suda, Kohei, Takahashi, Yuki, Yoshioka, Kazutoshi, Yokogawa, Ryo, Ogura, Atsushi

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Evaluation of Anisotropic Biaxial Strain Depending on Patterned Size in Ge1-xSnx Mesa Structures by Oil-Immersion Raman Spectroscopy von Murakami, Tatsumi, Takeuchi, Kazuma, Yokogawa, Ryo, Suda, Kohei, Ishihara, Seiya, Ogura, Atsushi

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Strain Evaluation of C or Ge implanted and Laser-annealed SiGe Thin Layers von Komago, Shota, Murakami, Tatsumi, Yoshioka, Kazutoshi, Yokogawa, Ryo, Sawamoto, Naomi, Borland, John, Kuroi, Takashi, Tabata, Toshiyuki, Huet, Karim, Horiguchi, Naoto, Ogura, Atsushi

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Evaluation of Anisotropic Strain in Ge1-xSnx Mesa Structures by X-ray Diffraction using Synchrotron Radiation von Murakami, Tatsumi, Suda, Kohei, Takahashi, Yuki, Yoshioka, Kazutoshi, Hibino, Yusuke, Yokogawa, Ryo, Hirosawa, Ichiro, Ogura, Atsushi

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Ge1-xSnx Film Growth on Ge Substrate by MOCVD using Low Temperature Decomposition Tetra (isopropyl) tin as Sn precursor von Murakami, Tatsumi, Suda, Kohei, Yoshioka, Kazutoshi, Takahashi, Yuki, Komago, Syouta, Sawamoto, Naomi, Machida, Hideaki, Ohshita, Yoshio, Ogura, Atsushi

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Evaluation of Anisotropic Biaxial Strain in Ge1-xSnx Mesa Structure by Oil-Immersion Raman Spectroscopy von Murakami, Tatsumi, Takeuchi, Kazuma, Yokogawa, Ryo, Suda, Kohei, Ishihara, Seiya, Ogura, Atsushi

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Relationship between Ag Coverage and Signal Enhancement In the Raman Analysis of the Strained-Si Surface von Kijims, Takahiro, Yamamoto, Shotaro, Yokogawa, Ryo, Takeuchi, Kazuma, Murakami, Tatsumi, Kosemura, Daisuke, Ogura, Atsushi

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X線の遠まわり反射によるひずみ半導体の格子ひずみ評価 von 宮下, 遥香, 天貝, 早希, 秋本, 晃一, 村上, 達海, 小椋, 厚志

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Evaluation of Anisotropic Three-Dimensional Strain Relaxation in Stripe-Shaped Ge 1-x Sn x Mesa Structure von Takahashi, Yuki, Yokogawa, Ryo, Murakami, Tatsumi, Hirosawa, Ichiro, Suda, Kohei, Ogura, Atsushi

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Determination of Phonon Deformation Potentials in Carbon-doped Silicon von Yoshioka, Kazutoshi, Yokogawa, Ryo, Murakami, Tatsumi, Komago, Shota, Sawamoto, Naomi, Ogura, Atsushi

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Strain Evaluation of Laser-Annealed SiGe Thin Layers von Komago, Shota, Murakami, Tatsumi, Yoshioka, Kazutoshi, Yokogawa, Ryo, Ogura, Atsushi, Borland, John O, Kuroi, Takashi, Tabata, Toshiyuki, Huet, Karim, Horiguchi, Naoto

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