Assessment of Tumor Cells in a Mouse Model of Diffuse Infiltrative Glioma by Raman Spectroscopy von Saito, Yahachi, Takeuchi, Ichiro, Wakabayashi, Toshihiko, Muraishi, Shuichi, Watabe, Naoki, Motomura, Kazuya, Kato, Akira, Momota, Hiroyuki, Ohka, Fumiharu, Natsume, Atsushi, Tanahashi, Kuniaki, Nakahara, Hitoshi

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Construction and performance of a Fourier-transform infrared phase-modulated ellipsometer for in-process surface diagnostics von TACHIBANA, K, SHIRAFUJI, T, MURAISHI, S

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Analysis of the Calcified Materials from Calcinosis Cutis von Konno, Minoru, Kikyo, Shinzo, Ando, Kazuto, Aita, Saburo, Muraishi, Shuichi, Inoue, Tatsuya

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ATR PROBE FOR HIGH-TEMPERATURE AND HIGH-PRESSURE SAMPLE AND CELL FOR THE HIGH-TEMPERATURE AND HIGH-PRESSURE SAMPLE von MURAISHI SHUICHI, MORIYA JUNICHIRO

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INFRARED MICROSPECTORMETER von MURAISHI SHUICHI

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FOOD INSPECTION DEVICE AND FOOD INSPECTION SYSTEM von MURAISHI SHUICHI, WATABE NAOKI, TAKASHIO MASACHIKA

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Silicon crystal evaluation method and semiconductor device fabrication method using the same von MURAISHI, SHUICHI, KANETA, HIROSHI

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CELL FOR OPTICAL MEASUREMENT OF HIGH TEMPERATURE AND HIGH PRESSURE von MURAISHI SHUICHI, MORIYA JUNICHIRO, NAKAHARA MASARU

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SILICON CRYSTAL EVALUATION METHOD AND SEMICONDUCTOR DEVICE FABRICATION METHOD USING THE SAME von MURAISHI, SHUICHI, KANETA, HIROSHI

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SILICON CRYSTAL OXYGEN EVALUATION METHOD USING FOURIER TRANSFORM INFRARED SPECTROSCOPY (FTIR) AND SEMICONDUCTOR DEVICE FABRICATION METHOD USING THE SAME von MURAISHI, SHUICHI, KANETA, HIROSHI

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EVALUATION OF SILICON CRYSTAL AND MANUFACTURE OF SEMICONDUCTOR DEVICE USING SAME von MURAISHI SHUICHI, KANEDA HIROSHI

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Silicon crystal evaluation method and semiconductor device fabrication method using the same von MURAISHI, SHUICHI, KANETA, HIROSHI

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EVALUATING METHOD FOR SILICON CRYSTAL von MURAISHI SHUICHI, KANEDA HIROSHI

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Far-infrared absorption by oxygen in silicon von YAMADA-KANETA, H, OGAWA, T, MURAISHI, S, KANETA, C, WADA, K

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PROBE TYPE ATR DEVICE von MURAISHI SHUICHI, NISHISAKA HISAKAZU

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ATR DEVICE OF SPECTROMETER von MURAISHI SHUICHI, NISHISAKA HISAKAZU

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INFRARED SPECTRUM PROCESSING METHOD von MURAISHI SHUICHI, KATO HIROSHI

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SAMPLE HOLDER FOR CRYOSTAT von MURAISHI SHUICHI, NISHISAKA HISAKAZU

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Sample press technique for laser Raman spectroscopy von KAJIURA, Teruo, SHINO, Hideo, MURAISHI, Shuichi

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Micro-Raman spectroscopy system for identifying foreign material on a semiconductor wafer von Ishihama, Masaru, Hattori, Hiroyuki, Muraishi, Shuichi, Ueda, Katsuhide

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