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  1. 1
    Electrical and Optical Characterization of GeON Layers with High-ĸ Gate Stacks on Germanium for Future MOSFETs

    Electrical and Optical Characterization of GeON Layers with High-ĸ Gate Stacks on Germanium for Future MOSFETs von Murad, Shahjahan N., Baine, Paul T., Montgomery, John H., McNeill, David W., Mitchell, S.J.N., Armstrong, B.M., Modreanu, Mircea

    Veröffentlicht in ECS transactions

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  2. 2
    Electrical and Optical Characterization of GeON Layers with high-k Gate Stacks on Germanium for Future MOSFETs

    Electrical and Optical Characterization of GeON Layers with high-k Gate Stacks on Germanium for Future MOSFETs von Murad, Shahjahan N., Baine, Paul T., Montgomery, John H., McNeill, David W., Mitchell, S.J.N., Armstrong, B.M., Modreanu, Mircea


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