Modeling of dimensions and sensing properties of gold gratings by spectroscopic ellipsometry and finite element method von Mukherjee, Deshabrato, Burger, Sven, Siefke, Thomas, Gour, Jeetendra, Bodermann, Bernd, Petrik, Peter

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Real-Time Ellipsometry at High and Low Temperatures von Mukherjee, Deshabrato, Petrik, Peter

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Dielectric function and interband critical points of compressively strained ferroelectric K 0.85 Na 0.15 NbO 3 thin film with monoclinic and orthorhombic symmetry von Bin Anooz, Saud, Petrik, Peter, Wang, Yankun, Mukherjee, Deshabrato, Schmidbauer, Martin, Schwarzkopf, Jutta

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Dielectric function and interband critical points of compressively strained ferroelectric K0.85Na0.15NbO3 thin film with monoclinic and orthorhombic symmetry von Bin Anooz, Saud, Petrik, Peter, Wang, Yankun, Mukherjee, Deshabrato, Schmidbauer, Martin, Schwarzkopf, Jutta

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Optimized sensing on gold nanoparticles created by graded-layer magnetron sputtering and annealing von Mukherjee, Deshabrato, Kertész, Krisztián, Zolnai, Zsolt, Kovács, Zoltán, Deák, András, Pálinkás, András, Osváth, Zoltán, Olasz, Dániel, Romanenko, Alekszej, Fried, Miklós, Burger, Sven, Sáfrán, György, Petrik, Péter

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In-situ spectral reflectance investigation of hetero-epitaxially grown β-Ga2O3 thin films on c-plane Al2O3 via MOVPE process von Chou, Ta-Shun, Bin Anooz, Saud, Grüneberg, Raimund, Rehm, Jana, Akhtar, Arub, Mukherjee, Deshabrato, Petrik, Peter, Popp, Andreas

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Nanostructures for in-situ surface-enhanced Kretschmann-Raether ellipsometry von Mukherjee, Deshabrato, Kalas, Benjamin, Burger, Sven, Safran, Gyorgy, Serenyi, Miklos, Fried, Miklos, Petrik, Peter

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