In situ observation of the initial growth process of carbon nanotubes by time‐resolved high resolution transmission electron microscopy von Watanabe, H., Hisada, Y., Mukainakano, S., Tanaka, N.

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Structure of the SiC (0 0 0 1) 3 × 3 reconstruction studied by surface X-ray diffraction von Voegeli, W., Akimoto, K., Aoyama, T., Sumitani, K., Nakatani, S., Tajiri, H., Takahashi, T., Hisada, Y., Mukainakano, S., Zhang, X., Sugiyama, H., Kawata, H.

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Structure of the SiC (0 0 0 1) 3 x 3 reconstruction studied by surface X-ray diffraction von Voegeli, W, Akimoto, K, Aoyama, T, Sumitani, K, Nakatani, S, Tajiri, H, Takahashi, T, Hisada, Y, Mukainakano, S, Zhang, X, Sugiyama, H, Kawata, H

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Reconstructions of 6H-SiC(0001) Surfaces Studied by Scanning Tunneling Microscopy and Reflection High-Energy Electron Diffraction von Hisada, Yoshiyuki, Hayashi, Kazuhiko, Kato, Kiyoshige, Aoyama, Tomohiro, Mukainakano, Shinichi, Ichimiya, Ayahiko

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Dependence of diffusion barrier properties in microstructure of reactively sputtered TiN films in Al alloy/TiN/Ti/Si system von Sobue, S., Yamauchi, T., Suzuki, H., Mukainakano, S., Takenaka, O., Hattori, T.

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Structural analysis of 6H-SiC(0001) surface by RHEED rocking curves von AOYAMA, Tomohiro, HAN, Yujie, ICHIMIYA, Ayahiko, HISADA, Yoshiyuki, MUKAINAKANO, Shinichi

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Initial Oxidation of 6H-SiC (0001) (3 x 3)-R30° and 3 x 3 Surfaces Studied by AES and RHEED von Voegeli, W., Hisada, Yoshiyuki, Mukainakano, Shinichi, Aoyama, Tomohiro, Ichimiya, Ayahiko

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Structural study of SiC(0001)3 x 3 surface by surface X-ray diffraction von Aoyama, T, Akimoto, K, Ichimiya, A, Hisada, Y, Mukainakano, S, Emoto, T, Tajiri, H, Takahashi, T, Sugiyama, H, Zhang, X, Kawata, H

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Structural study of SiC(0 0 0 1)3×3 surface by surface X-ray diffraction von Aoyama, T., Akimoto, K., Ichimiya, A., Hisada, Y., Mukainakano, S., Emoto, T., Tajiri, H., Takahashi, T., Sugiyama, H., Zhang, X., Kawata, H.

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Adsorbate effects of the surface structure of 6H-SiC(0001) root 3 x root 3-R30 deg von Aoyama, T, Hisada, Y, Mukainakano, S, Ichimiya, A

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22aXJ-10 Structural changes in the SiC(0001)-3×3 and (√ ×√ )-R30°reconstructions due to exposure to oxygen von Voegeli, W., Akimoto, K., Aoyama, T., Urata, T., Ichimiya, A., Nakatani, S., Sumitani, K., Takahashi, T., Hisada, Y., Mitsuoka, Y., Mukainakano, S., Sugiyama, H., Kawata, H.

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Solid-phase reactions in Al alloy/TiN/Ti/Si systems observed by in situ cross-sectional TEM von SOBUE, S, MUKAINAKANO, S, UENO, Y, HATTORI, T

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22aXJ-10 酸化によるSiC(0001)-3×3と√ ×√ -R30°表面構造の変化(表面界面構造,領域9,表面・界面,結晶成長) von 秋本, 晃一, 青山, 朋弘, 浦田, 明晃, 一宮, 彪彦, 中谷, 信一郎, 隅谷, 和嗣, 高橋, 敏男, 久田, 祥之, 光岡, 義仁, 向中野, 信一, 杉山, 弘, 河田, 洋

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Structural Study of SiC(0001)3×3 Surface by Surface X-Ray Diffraction von Aoyama, T., Akimoto, K., Ichimiya, A., Hisada, Y., Mukainakano, S., Emoto, T., Tajiri, H., Takahashi, T., Sugiyama, H., Zhang, X., Kawata, H.

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Dependence of diffusion barrier properties in microstructure of reactively sputtered TiN films in Al alloy/TiN/Ti/Si system von SOBUE, S, YAMAUCHI, T, SUZUKI, H, MUKAINAKANO, S, TAKENAKA, O, HATTORI, T

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Atomic models of (∛×∛) R30° reconstruction on hexagonal 6H–SiC(0001) surface von Han, Y., Aoyama, T., Ichimiya, A., Hisada, Y., Mukainakano, S.

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8aSM-5 表面X線回折法によるSiC(0001)3×3構造の研究(表面界面構造・電子物性,領域9) von 青山, 朋弘, 秋本, 晃一, 一宮, 彪彦, 久田, 祥之, 向中野, 信一, 榎本, 貴志, 田尻, 寛男, 高橋, 敏男, 杉山, 弘, 張, 小威, 河田, 洋

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Atomic models of ( square root 3x square root 3)R30 degree reconstruction on hexagonal 6H-SiC(0001) surface von Han, Y, Aoyama, T, Ichimiya, A, Hisada, Y, Mukainakano, S

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Chemical synthesis of the crustacean insulin‐like peptide with four disulfide bonds von Katayama, Hidekazu, Mukainakano, Takafumi, Kogure, Junya, Ohira, Tsuyoshi

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Surface modification of Ni catalysts with trace Pt for oxidative steam reforming of methane von Li, Baitao, Kado, Shigeru, Mukainakano, Yuya, Miyazawa, Tomohisa, Miyao, Toshihiro, Naito, Shuichi, Okumura, Kazu, Kunimori, Kimio, Tomishige, Keiichi

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