A reaction-layer mechanism for the delayed failure of micron-scale polycrystalline silicon structural films subjected to high-cycle fatigue loading von Muhlstein, C.L, Stach, E.A, Ritchie, R.O

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High-cycle fatigue and durability of polycrystalline silicon thin films in ambient air von Muhlstein, C.L., Brown, S.B., Ritchie, R.O.

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Mechanisms for Fatigue of Micron-Scale Silicon Structural Films von Alsem, D. H., Pierron, O. N., Stach, E. A., Muhlstein, C. L., Ritchie, R. O.

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Relating Nonuniform Deformations to Fracture in Uniaxially Loaded Non-Woven Fiber Networks von Na, Y. J., Muhlstein, C. L.

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Fatigue of polycrystalline silicon for microelectromechanical system applications: crack growth and stability under resonant loading conditions von Muhlstein, C.L., Howe, R.T., Ritchie, R.O.

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Correlating bonded joint deformation with failure using a free surface strain field mining methodology von Collins, J. G., Dillon, G. P., Strauch, E. C., Lanning, W. R., Muhlstein, C. L.

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Reconciling fracture toughness parameter contradictions in thin ductile metal sheets von Lanning, W. R., Javaid, S. S., Muhlstein, C. L.

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On the origins of anomalous elastic moduli and failure strains of GaP nanowires von Yashinski, M S, Gutiérrez, H R, Muhlstein, C L

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Characterization of structural films using microelectromechanical resonators von MUHLSTEIN, C. L.

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The role of deposited layers in the nonlinear constitutive behavior of Si nanowires von Yashinski, M. S., Muhlstein, C. L.

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Methodology for low- and high-cycle fatigue characterization with kHz-frequency resonators von Pierron, O.N., Abnet, C.C., Muhlstein, C.L.

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The extended range of reaction-layer fatigue susceptibility of polycrystalline silicon thin films von PIERRON, O. N, MUHLSTEIN, C. L

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High-cycle fatigue of single-crystal silicon thin films von Muhlstein, C.L., Brown, S.B., Ritchie, R.O.

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High-cycle fatigue of micron-scale polycrystalline silicon films: fracture mechanics analyses of the role of the silica/silicon interface von Muhlstein, C.L., Ritchie, R.O.

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Dependence on diameter and growth direction of apparent strain to failure of Si nanowires von Steighner, M. S., Snedeker, L. P., Boyce, B. L., Gall, K., Miller, D. C., Muhlstein, C. L.

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Nanomechanical properties of commercial float glass von Howell, J.A., Hellmann, J.R., Muhlstein, C.L.

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Characteristic dimensions and the micro-mechanisms of fracture and fatigue in `nano' and `bio' materials von Ritchie, R.O., Kruzic, J.J., Muhlstein, C.L., Nalla, R.K., Stach, E.A.

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Correlations between free volume and pile-up behavior in nanoindentation reference glasses von Howell, J.A., Hellmann, J.R., Muhlstein, C.L.

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Further considerations on the high-cycle fatigue of micron-scale polycrystalline silicon von Alsem, D.H., Muhlstein, C.L., Stach, E.A., Ritchie, R.O.

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