Counting graphene layers with very slow electrons von Frank, Ludĕk, Mikmeková, Eliška, Müllerová, Ilona, Lejeune, Michaël

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Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors von Konvalina, Ivo, Paták, Aleš, Zouhar, Martin, Müllerová, Ilona, Fořt, Tomáš, Unčovský, Marek, Materna Mikmeková, Eliška

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A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning von Materna Mikmeková, Eliška, Materna, Jiří, Konvalina, Ivo, Mikmeková, Šárka, Müllerová, Ilona, Asefa, Tewodros

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Scanning tunneling microscopy in the field-emission regime: Formation of a two-dimensional electron cascade von Werner, Wolfgang S. M., Oral, Martin, Radlička, Tomáš, Zelinka, Jiří, Müllerová, Ilona, Bellissimo, Alessandra, Bertolini, Gabriele, Cabrera, Hugo, Gürlü, Oguzhan

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The trajectories of secondary electrons in the scanning electron microscope von Konvalina, Ivo, Müllerová, Ilona

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In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM von Konvalina, Ivo, Mika, Filip, Krátký, Stanislav, Materna Mikmeková, Eliška, Müllerová, Ilona

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Methods of the electron induced cleanning in SEM von Müllerová, Ilona, Konvalina, Ivo, Materna Mikmeková, Eliška

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Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer von Konvalina, Ivo, Daniel, Benjamin, Zouhar, Martin, Paták, Aleš, Müllerová, Ilona, Frank, Luděk, Piňos, Jakub, Průcha, Lukáš, Radlička, Tomáš, Werner, Wolfgang S M, Mikmeková, Eliška Materna

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The injected-charge contrast mechanism in scanned imaging of doped semiconductors by very slow electrons von Frank, Lude˘k, Müllerová, Ilona

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Imaging of specimens at optimized low and very low energies in scanning electron microscopes von Müllerová, Ilona

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Surface imaging with UHV SLEEM and SEM LEEM von Mikmeková, Šárka, Jánský, Pavel, Kolařík, Vladimír, Müllerová, Ilona

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Simulations and measurements in scanning electron microscopes at low electron energy von Walker, Christopher G.H., Frank, Luděk, Müllerová, Ilona

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The potential of the scanning low energy electron microscopy for the examination of aluminum based alloys and composites von Matsuda, Kenji, Ikeno, Susumu, Müllerová, Ilona, Frank, Luděk

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Study of Graphene and Thin Foils by a Time-of-Flight Spectrometer for Low Landing Energies von Konvalina, Ivo, Daniel, Benjamin, Zouhar, Martin, Paták, Aleš, Průcha, Lukáš, Piňos, Jakub, Müllerová, Ilona, Materna Mikmeková, Eliška

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Field emission properties of single crystalline W5O14 and W18O49 nanowires von Saqib, Muhammad, Jelenc, Janez, Pirker, Luka, Škapin, Srečo D., De Pietro, Lorenzo, Ramsperger, Urs, Knápek, Alexandr, Müllerová, Ilona, Remškar, Maja

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Imaging Ferroelectric Nanodomains in Strained BiFeO3 Nanoscale Films Using Scanning Low-Energy Electron Microscopy: Implications for Low-Power Devices von Ma, Haili, Mikmeková, Šárka, Konvalina, Ivo, Yin, Xiaozhe, Sun, Fei, Piňos, Jakub, Vaškovicová, Naděžda, Průcha, Lukáš, Müllerová, Ilona, Mikmeková, Eliška Materna, Chen, Deyang

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Applications of Low and Ultra-low Energy Scanning Electron Microscopy von Müllerová, Ilona, Frank, Luděk, Mikmeková, Šárka, Materna Mikmeková, Eliška

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Contamination Mitigation Strategy for Ultra-Low Energy Electron Microscopy and Spectroscopy von Materna Mikmeková, Eliška, Frank, Luděk, Konvalina, Ivo, Müllerová, Ilona, Zhang, Tao, Asefa, Tewodros

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The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements von Konvalina, Ivo, Zouhar, Martin, Daniel, Benjamin, Paták, Aleš, Piňos, Jakub, Frank, Luděk, Müllerová, Ilona, Mikmeková, Eliška Materna

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Very Low Energy Electron Transmission Spectroscopy of 2D Materials von Konvalina, Ivo, Daniel, Benjamin, Zouhar, Martin, Paták, Aleš, Piňos, Jakub, Radlička, Tomáš, Frank, Luděk, Müllerová, Ilona, Materna-Mikmeková, Eliška

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