Big Data Analytics for Smart Manufacturing: Case Studies in Semiconductor Manufacturing von Moyne, James, Iskandar, Jimmy

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A Requirements Driven Digital Twin Framework: Specification and Opportunities von Moyne, James, Qamsane, Yassine, Balta, Efe C., Kovalenko, Ilya, Faris, John, Barton, Kira, Tilbury, Dawn M.

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Big Data Capabilities Applied to Semiconductor Manufacturing Advanced Process Control von Moyne, James, Samantaray, Jamini, Armacost, Michael

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Overcoming Challenges Associated with Developing Industrial Prognostics and Health Management Solutions von Toothman, Maxwell, Braun, Birgit, Bury, Scott J, Moyne, James, Tilbury, Dawn M, Ye, Yixin, Barton, Kira

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A Methodology to Develop and Implement Digital Twin Solutions for Manufacturing Systems von Qamsane, Yassine, Moyne, James, Toothman, Maxwell, Kovalenko, Ilya, Balta, Efe C., Faris, John, Tilbury, Dawn M., Barton, Kira

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Toward an Automated Learning Control Architecture for Cyber-Physical Manufacturing Systems von Kovalenko, Ilya, Moyne, James, Bi, Mingjie, Balta, EFE C., Ma, Wenyuan, Qamsane, Yassine, Zhu, Xiao, Mao, Z. Morley, Tilbury, Dawn M., Barton, Kira

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An Approach for Factory-Wide Control Utilizing Virtual Metrology von Khan, A.A., Moyne, J.R., Tilbury, D.M.

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Digital Twin-Based Cyber-Attack Detection Framework for Cyber-Physical Manufacturing Systems von Balta, Efe C., Pease, Michael, Moyne, James, Barton, Kira, Tilbury, Dawn M.

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The Emergence of Industrial Control Networks for Manufacturing Control, Diagnostics, and Safety Data von Moyne, James R., Tilbury, Dawn M.

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A digital twin framework for prognostics and health management von Toothman, Maxwell, Braun, Birgit, Bury, Scott J., Moyne, James, Tilbury, Dawn M., Ye, Yixin, Barton, Kira

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Opportunities and Challenges to Integrate Artificial Intelligence Into Manufacturing Systems: Thoughts From a Panel Discussion [Opinion] von Kovalenko, Ilya, Barton, Kira, Moyne, James, Tilbury, Dawn M.

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How Lithography and Metrology Are Enabling Yield in the Next Generation of Semiconductor Patterning von Neisser, Mark, Orji, Ndubuisi G., Levinson, Harry J., Celano, Umberto, Moyne, James, Mashiro, Supika, Wilcox, Dan, Libman, Slava

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An Adaptive Modeling Framework for Bearing Failure Prediction von Zhao, Yuntian, Toothman, Maxwell, Moyne, James, Barton, Kira

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An Online Virtual Metrology Model With Sample Selection for the Tracking of Dynamic Manufacturing Processes With Slow Drift von Feng, Jianshe, Jia, Xiaodong, Zhu, Feng, Moyne, James, Iskandar, Jimmy, Lee, Jay

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SEMI E133-The Process Control System Standard: Deriving a Software Interoperability Standard for Advanced Process Control in Semiconductor Manufacturing von Moyne, J.R., Hajj, H., Beatty, K., Lewandowski, R.

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Yield Management Enhanced Advanced Process Control System (YMeAPC)-Part I: Description and Case Study of Feedback for Optimized Multiprocess Control von Moyne, James, Schulze, Brad

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Categorization of Anomalies in Smart Manufacturing Systems to Support the Selection of Detection Mechanisms von Lopez, Felipe, Saez, Miguel, Yuru Shao, Balta, Efe C., Moyne, James, Mao, Z. Morley, Barton, Kira, Tilbury, Dawn

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Network design consideration for distributed control systems von Feng-Li Lian, Moyne, J., Tilbury, D.

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A Hierarchical Incentive Arbitration Scheme for Coordinated PEV Charging Stations von Anand, Dhananjay M., de Salis, Rupert Tull, Yijie Cheng, Moyne, James, Tilbury, Dawn M.

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A software-defined framework for the integrated management of smart manufacturing systems von Lopez, Felipe, Shao, Yuru, Mao, Z. Morley, Moyne, James, Barton, Kira, Tilbury, Dawn

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