Electron probe microanalysis: A review of recent developments and applications in materials science and engineering von Llovet, Xavier, Moy, Aurélien, Pinard, Philippe T., Fournelle, John H.

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ϕ(ρz) Distributions in Bulk and Thin Film Samples for EPMA. Part 1: A Modified ϕ(ρz) Distribution for Bulk Materials, Including Characteristic and Bremsstrahlung Fluorescence von Moy, Aurélien, Fournelle, John

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ϕ(ρz) Distributions in Bulk and Thin-Film Samples for EPMA. Part 2: BadgerFilm: A New Thin-Film Analysis Program von Moy, Aurélien, Fournelle, John

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Standardless Quantification of Heavy Elements by Electron Probe Microanalysis von Moy, Aurélien, Merlet, Claude, Dugne, Olivier

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Reprint of: Electron probe microanalysis: A review of recent developments and applications in materials science and engineering von Llovet, Xavier, Moy, Aurélien, Pinard, Philippe T., Fournelle, John H.

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Electron Probe Microanalysis of Transition Metals using L lines: The Effect of Self-absorption von Llovet, Xavier, Moy, Aurélien, Fournelle, John H.

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Quantitative Measurement of Iron-Silicides by EPMA Using the Fe Lα and Lβ X-ray Lines: A New Twist to an Old Approach von Moy, Aurélien, Fournelle, John, von der Handt, Anette

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Measurements of absolute Mα x-ray production cross sections of heavy elements Au, Pb, Bi, and U by electron impact von Merlet, Claude, Moy, Aurélien, Llovet, Xavier, Dugne, Olivier

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BadgerFilm: a versatile thin film analysis program for EPMA and more von Moy, Aurélien, Fournelle, John

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BadgerFilm: An Open Source Thin Film Analysis Program von Moy, Aurélien, Fournelle, John

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Electron probe microanalysis of transition metals using L-lines: the effect of self-absorption von Llovet, Xavier, Moy, Aurélien, Fournelle, John

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Quantitative Electron Probe Microanalysis of Fe at Low Accelerating Voltage Using the Lα and Lβ X-ray Lines von Moy, Aurélien, Fournelle, John

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The EPMA Matrix Correction: All Elements Must Be Present for Accuracy: Four Examples with B, C, O and F von Fournelle, John, Moy, Aurélien, Nachlas, William, Donovan, John

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Universal Mean Atomic Number curves for EPMA calculated by Monte Carlo simulations von Moy, Aurélien, von der Handt, Anette, Fournelle, John, Nachlas, William, Donovan, John

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Quantitative Microanalysis of Chromites and Garnets at Low kV Using Fe and Cr Lα and Lβ X-ray Lines von von der Handt, Anette, Moy, Aurélien, Fournelle, John

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Using Calibration Curves to Quantify Fe with the Soft Lα and Lβ X-ray Lines von Moy, Aurélien, von der Handt, Anette, Fournelle, John

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An EPMA Study of the Soft Fe Lα-Lβ X-ray lines in Fe-silicide, Olivine and Fe-sulfide Minerals by SXES and WDS von Moy, Aurélien, von der Handt, Anette, Fournelle, John

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Proposal: Let's Develop a Community Consensus K-ratio Database von Ritchie, Nicholas, Newbury, Dale, Bullock, Emma, Carpenter, Paul, Donovan, John, Fournelle, John, von der Handt, Anette, Lowers, Heather, Moy, Aurélien, Neill, Owen, Vicenzi, Edward

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Measurements of absolute M[alpha] x-ray production cross sections of heavy elements Au, Pb, Bi, and U by electron impact von Merlet, Claude, Moy, Aurélien, Llovet, Xavier, Dugne, Olivier

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A Study on the Change of the Fe La Mass Absorption Coefficients and Fluorescence Yields in Iron Silicide Samples by EPMA von Moy, Aurelien, Fournelle, John

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