Laser SEE Sensitivity Mapping of SRAM Cells von Chugg, A.M., Burnell, A.J., Moutrie, M.J., Jones, R., Harboe-Sorensen, R.

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Broadening of the variance of the number of upsets in a read-cycle by MBUs von Chugg, A.M., Moutrie, M.J., Jones, R.

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Single particle dark current spikes induced in CCDs by high energy neutrons von Chugg, A.M., Jones, R., Moutrie, M.J., Armstrong, J.R., King, D.B.S., Moreau, N.

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Analyses of images of neutron interactions and single particle displacement damage in CCD arrays von Chugg, A.M., Jones, R., Moutrie, M.J., Truscott, P.R.

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Analyses of CCD images of nucleon-silicon interaction events von Chugg, A.M., Jones, R., Moutrie, M.J., Dyer, C.S., Ryden, K.A., Truscott, P.R., Armstrong, J.R., King, D.B.S.

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Laser Simulation of single event effects in pulse width Modulators von Chugg, A.M., Jones, R., Moutrie, M.J., Duncan, P.H., Sorensen, R.H., Mattsson, S., Larsson, S., Fitzgerald, R., O'Shea, T.

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A Statistical Technique to Measure the Proportion of MBU's in SEE Testing von Chugg, A.M., Moutrie, M.J., Burnell, A.J., Jones, R.

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Application of charge-coupled devices to multiple-bit-upset analysis in radiation environments von Platt, S.P., Torok, Z., Chugg, A.M., Moutrie, M.J., Burnell, A.J.

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Analyses of CCD images of nucleon-silicon interaction events von Chugg, A.M., Jones, R., Moutrie, M.J., Dyer, C.S., Ryden, K.A., Truscott, P.R., Armstrong, J.R., King, D.B.S.

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