Dynamics of metastable defects in a-Si:H/SiN TFTs von Merticaru, A.R., Mouthaan, A.J.

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Progressive degradation in a-Si:H/SiN thin film transistors von Merticaru, A.R., Mouthaan, A.J., Kuper, F.G.

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Mechanical stress evolution and the blech length: 2D simulation of early electromigration effects von Petrescu, V., Mouthaan, A.J., Schoenmaker, W., Salm, C.

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Determination of the contribution of defect creation and charge trapping to the degradation of a-Si:H/SiN TFTs at room temperature and low voltages von Merticaru, A.R., Mouthaan, A.J., Kuper, F.G.

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Dealing with hot-carrier aging in nMOS and DMOS, models, simulations and characterizations von Mouthaan, A.J, Salm, C, Lunenborg, M.M, de Wolf, M.A.R.C, Kuper, F.G

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Turn-on speed of grounded gate nMOS ESD protection transistors von Meneghesso, G., Luchies, J.R.M., Kuper, F.G., Mouthaan, A.J.

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Comprehensive physical modeling of nmosfet hot-carrier-induced degradation von Lunenborg, M.M., De Graaff, H.C., Mouthaan, A.J., Verweij Mesa, J.F.

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Early resistance change and stress/electromigration modeling in aluminum interconnects von Petrescu, V., Mouthaan, A.J., Schoenmaker, W.

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Layout to circuit extraction for three-dimensional thermal-electrical circuit simulation of device structures von Krabbenborg, B.H., Bosma, A., de Graaff, H.C., Mouthaan, A.J.

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Fast temperature cycling and electromigration induced thin film cracking in multilevel interconnection: experiments and modeling von Nguyen, H.V., Salm, C., Vroemen, J., Voets, J., Krabbenborg, B., Bisschop, J., Mouthaan, A.J., Kuper, F.G.

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Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime von Nguyen, H.V., Salm, C., Wenzel, R., Mouthaan, A.J., Kuper, F.G.

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Buried injector logic, a vertical IIL using deep ion implantation von Mouthaan, A.J.

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Current Degradation of a-Si:H/SiN TFTs at Room Temperature and Low Voltages von Merticaru, A.R., Mouthaan, A.J., Kuper, F.G.

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An empirical model for early resistance changes due to electromigration von Niehof, J, De Graaff, H.C, Mouthaan, A.J, Verwey, J.F

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Analysis of the modal behavior of an antiguide diode laser array with Talbot filter von Van Eijk, P.D.

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Reliability modelling with respect to circuit applications von Verweij, J. F., Mouthaan, A. J.

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Impact of three variants of prolonged exposure therapy on comorbid diagnoses in patients with childhood abuse-related PTSD von Hoeber C.M., Kullberg M.-L.J., Oprel D.A.C., Schoorl M., Van Minnen A., Antypa N., Mouthaan J., De Kleine R.A., Van der Does A.J.W.

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Test chip for detecting thin film cracking induced by fast temperature cycling and electromigration in multilevel interconnect systems von Nguyen, H.V., Salm, C., Vroemen, J., Voets, J., Krabbenborg, B., Bisschop, J., Mouthaan, A.J., Kuper, F.G.

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2D modelling of mechanical stress evolution and electromigration in confined aluminum interconnects von Petrescu, V., Mouthaan, A.J.

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Significance of including substrate capacitance in the full chip circuit model of ICs under CDM stress von Sowariraj, M.S.B., de Jong, P.C., Cora, S.M., Smedes, T., Mouthaan, A.J.T., Kuper, F.G.

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