Characterization of HTRB stress effects on SiC MOSFETs using photon emission spectral signatures von Moultif, N., Joubert, E., Masmoudi, M., Latry, O.

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Reliability Study of Mechatronic Power Components Using Spectral Photon Emission Microscopy von Moultif, N., Joubert, E., Latry, O.

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Reliability and failure analysis in power GaN-HEMTs during S-band pulsed-RF operating von Moultif, N., Duguay, S., Latry, O., Ndiaye, M., Joubert, E.

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S-band pulsed-RF operating life test on AlGaN/GaN HEMT devices for radar application von Moultif, N., Latry, O., Ndiaye, M., Neveu, T., Joubert, E., Moreau, C., Goupy, J-F.

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Analyse de défaillance dans les transistors de puissance grand gap par électroluminescence spectrale von Moultif, Niemat

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