Characterization of HTRB stress effects on SiC MOSFETs using photon emission spectral signatures von Moultif, N., Joubert, E., Masmoudi, M., Latry, O.

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Reliability Study of Mechatronic Power Components Using Spectral Photon Emission Microscopy von Moultif, N., Joubert, E., Latry, O.

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Reliability and failure analysis in power GaN-HEMTs during S-band pulsed-RF operating von Moultif, N., Duguay, S., Latry, O., Ndiaye, M., Joubert, E.

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S-band pulsed-RF operating life test on AlGaN/GaN HEMT devices for radar application von Moultif, N., Latry, O., Ndiaye, M., Neveu, T., Joubert, E., Moreau, C., Goupy, J-F.

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A Thorough Evaluation of GaN HEMT Degradation under Realistic Power Amplifier Operation von Bosi, Gianni, Raffo, Antonio, Vadalà, Valeria, Giofrè, Rocco, Crupi, Giovanni, Vannini, Giorgio

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Electrical Properties and Reliability of AlGaN/GaN High Electron Mobility Transistor under RF Overdrive Stress at High Temperature von Liu, Chang, Chen, Yiqiang, Xie, Yuhan, Liu, Hongxia, Cai, Zongqi

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Application of Thermoelectric Generators for Low-Temperature-Gradient Energy Harvesting von Liu, Yuming, Riba, Jordi-Roger, Moreno-Eguilaz, Manuel, Sanllehí, Josep

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A novel hybrid framework for prioritization of failure modes during forging die-design von Sharma, Abhishek, Raj, Mathala Prithvi, Hussain, V. M. S.

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Failure mode and effects analysis of forging die design: An integrated approach von Sharma, Abhishek, Hussain, V.M.S., Abhishek Kumar, P., Prithvi Raj, Mathala

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Analysis of buoyancy assisting and opposing flows of colloidal mixture of titanium oxide, silver, and aluminium oxide nanoparticles with water due to exponentially stretchable surf... von Madhukesh, J.K., Naveen Kumar, R., Khan, Umair, Gill, Rana, Raizah, Zehba, Elattar, Samia, Eldin, Sayed M, Shah, S.H.A.M., Rajappa, B., Abed, Ahmed M.

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SiC Doping Impact during Conducting AFM under Ambient Atmosphere von Villeneuve-Faure, Christina, Boumaarouf, Abdelhaq, Shah, Vishal, Gammon, Peter M, Lüders, Ulrike, Coq Germanicus, Rosine

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