The relationship between structural and electrical properties of the post-deposition annealed Er2O3/n-Si hetero-structures von Kahraman, Aysegul, Morkoc, Berk, Yilmaz, Ercan

Volltext

Effects of the oxide/interface traps on the electrical characteristics in Al/Yb2O3/SiO2/n-Si/Al MOS capacitors von Morkoç, Berk, Kahraman, Ayşegül, Yılmaz, Ercan

Volltext

Post-deposition annealing effect on the structural and electrical properties of ytterbium oxide as an alternative gate dielectric von Morkoc, Berk, Kahraman, Aysegul, Yilmaz, Ercan

Volltext

Electrical Parameters of the Erbium Oxide MOS Capacitor for Different Frequencies von MORKOC, Berk, KAHRAMAN, Ayşegül, AKTAG, Aliekber, YILMAZ, Ercan

Volltext

Dose responses of the SiO2 used in radiation sensors in field effect transistor form von Morkoc, Berk, Yilmaz, Ozan, Yilmaz, Ercan, Kahraman, Aysegul

Volltext

Dose responses of the Si[O.sub.2] used in radiation sensors in field effect transistor form von Kahraman, Aysegul, Morkoc, Berk, Yilmaz, Ozan, Yilmaz, Ercan

Volltext

EVALUATION OF THE RadFET RADIATION SENSOR PERFORMANCE IN 18 MV-EXTERNAL BEAM von Ayşegül Kahraman, Berk Morkoç, Dinçer Yeğen, Ercan Yılmaz

Volltext