A near-field scanned microwave probe for spatially localized electrical metrology von Talanov, Vladimir V., Scherz, André, Moreland, Robert L., Schwartz, Andrew R.

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Noncontact dielectric constant metrology of low-k interconnect films using a near-field scanned microwave probe von Talanov, Vladimir V., Scherz, André, Moreland, Robert L., Schwartz, Andrew R.

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Near-field microwave microscope with improved sensitivity and spatial resolution von Tselev, Alexander, Anlage, Steven M., Christen, Hans M., Moreland, Robert L., Talanov, Vladimir V., Schwartz, Andrew R.

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Noncontact dielectric constant metrology of low- k interconnect filmsusing a near-field scanned microwave probe von Talanov, Vladimir V., Scherz, André, Moreland, Robert L., Schwartz, Andrew R.

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Noncontact dielectric constant metrology of low-k interconnect films using a near-field scanned microwave probe von Talanov, Vladimir V, Scherz, André, Moreland, Robert L, Schwartz, Andrew R

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A near-field scanned microwave probe for spatially localized electrical metrology von Talanov, Vladimir V, Scherz, Andre, Moreland, Robert L, Schwartz, Andrew R

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Method and system for measurement of dielectric constant of thin films using a near field microwave probe von Talanov, Vladimir V, Schwartz, Andrew R, Scherz, Andre, Moreland, Robert L

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Method and system for measurement of dielectric constant of thin films using a near field microwave probe von MORELAND ROBERT L, SCHERZ ANDRE, TALANOV VLADIMIR V, SCHWARTZ ANDREW R

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Some Thoughts on an Effective Pharmacy LawRead before Thirty-first Annual Convention, Minnesota State Pharmaceutical Association, St. Paul, February 10, 1915 von Moreland, Robert L.

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Some Thoughts on an Effective Pharmacy Law von Moreland, Robert L.

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A near-field scanned microwave probe for spatially localized electrical metrology von Talanov, Vladimir V, Scherz, Andre, Moreland, Robert L, Schwartz, Andrew R

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Apertured probes for localized measurements of a material's complex permittivity and fabrication method von MORELAND ROBERT L, CHRISTEN HANS M, TALANOV VLADIMIR V, SCHWARTZ ANDREW R

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Apertured probes for localized measurements of a material's complex permittivity and fabrication method von Moreland, Robert L, Christen, Hans M, Talanov, Vladimir V, Schwartz, Andrew R

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Method and system for measurement of dielectric constant of thin films using a near field microwave probe von MORELAND ROBERT L, SCHERZ ANDRE, TALANOV VLADIMIR V, SCHWARTZ ANDREW R

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System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes von MORELAND ROBERT L, TALANOV VLADIMIR V, CHRISTEN HANS M, SCHWARTZ ANDREW R

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System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes von Talanov, Vladimir V, Moreland, Robert L, Schwartz, Andrew R, Christen, Hans M

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APERTURE PROBE FOR LOCAL MEASUREMENT OF COMPLEX DIELECTRIC CONSTANT OF MATERIAL AND MANUFACTURING METHOD von MORELAND ROBERT L, CHRISTEN HANS M, TALANOV VLKADIMIR V, SCHWARTZ ANDREW R

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Apertured probes for localized measurements of a material's complex permittivity and fabrication method von MORELAND, ROBERT L, CHRISTEN, HANS M, TALANOV, VLADIMIR V, SCHWARTZ, ANDREW R

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Apertured probes for localized measurements of a material's complex permittivity and fabrication method von MORELAND, ROBERT L, CHRISTEN, HANS M, TALANOV, VLADIMIR V, SCHWARTZ, ANDREW R

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Apertured probes for localized measurements of a material's complex permittivity and fabrication method von Moreland, Robert L, Christen, Hans M, Talanov, Vladimir V, Schwartz, Andrew R

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