Delay-line based embedded memory access time measurement: Circuit, implementation and characterization techniques von Moo Kit Lee, Wei Khoon Teng, Krishnasamy, R. K., Wei Tee Ng

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IDDQ Test Challenges in Nanotechnologies: A Manufacturing Test Strategy von P'ng, Yu Wei, Lee, Moo Kit, Ng, Peng Weng, Ong, Chin Hu

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Anti-tamper system based on dual random bits generators for integrated circuits von A/L KRISHNASAMY RAJ KUMAR, THUM CHIA CHIEH, LEE MOO KIT

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Anti-tamper system based on dual random bits generators for integrated circuits von A L KRISHNASAMY RAJ KUMAR, THUM CHIA CHIEH, LEE MOO KIT

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ANTI-TAMPER SYSTEM BASED ON DUAL RANDOM BITS GENERATORS FOR INTEGRATED CIRCUITS von THUM, CHIA CHIEH, LEE, MOO KIT, A/L KRISHNASAMY, RAJ KUMAR

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ANTI-TAMPER SYSTEM BASED ON DUAL RANDOM BITS GENERATORS FOR INTEGRATED CIRCUITS von A/L KRISHNASAMY RAJ KUMAR, THUM CHIA CHIEH, LEE MOO KIT

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Anti-tamper system based on dual random bits generators for integrated circuits von KRISHNASAMY, RAJ KUMAR A/L, THUM, CHIA CHIEH, LEE, MOO KIT

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Anti-tamper system based on dual random bits generators for integrated circuits von KRISHNASAMY, RAJ KUMAR A/L, THUM, CHIA CHIEH, LEE, MOO KIT

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A security analysis of the 802.11s wireless mesh network routing protocol and its secure routing protocols von Tan, Whye Kit, Lee, Sang-Gon, Lam, Jun Huy, Yoo, Seong-Moo

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Attomole Level Protein Sequencing by Edman Degradation Coupled with Accelerator Mass Spectrometry von Miyashita, Masahiro, Presley, Jack M., Buchholz, Bruce A., Lam, Kit S., Lee, Young Moo, Vogel, John S., Hammock, Bruce D.

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