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Quantification of scanning capacitance microscopy imaging of the pn junction through electrical simulation von O’Malley, M. L., Timp, G. L., Moccio, S. V., Garno, J. P., Kleiman, R. N.

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Understanding the limits of ultrathin SiO2 and Si-O-N gate dielectrics for sub-50 nm CMOS von GREEN, M. L, SORSCH, T. W, TIMP, G. L, MULLER, D. A, WEIR, B. E, SILVERMAN, P. J, MOCCIO, S. V, KIM, Y. O

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Workers' Rights as Human Rights: Organized Labor and Rights Discourse in Canada von Savage, Larry

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The relentless march of the MOSFET gate oxide thickness to zero von Timp, G, Bude, J, Baumann, F, Bourdelle, K.K, Boone, T, Garno, J, Ghetti, A, Green, M, Gossmann, H, Kim, Y, Kleiman, R, Kornblit, A, Klemens, F, Moccio, S, Muller, D, Rosamilia, J, Silverman, P, Sorsch, T, Timp, W, Tennant, D, Tung, R, Weir, B

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Electrical simulation of scanning capacitance microscopy imaging of the pn junction with semiconductor probe tips von O’Malley, M. L., Timp, G. L., Timp, W., Moccio, S. V., Garno, J. P., Kleiman, R. N.

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Synchronizing Meanings and Other Day Laborer Organizing Strategies: Lessons from Denver von Camou, Michelle

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The Rise and Decline of the Democratic Organizational Culture in the South African Labor Movement, 1973 to 2000 von Buhlungu, Sakhela

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Mapping the Boundaries of Human Rights at Work: Questioning How the ILO Defines Labor Rights and Social Justice von Hilgert, Jeff

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Would the Employee Free Choice Act Effectively Protect the Right to Unionize?: Evidence from a South Florida Nursing Home Case von Nissen, Bruce

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Polish Workers in Ireland: A Contented Proletariat? von Turner, Thomas, D'Art, Daryl, Cross, Christine

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Workers' Rights as Human Rights: Legal Debate and Impact on Workers von Kaminski, Michelle, Moccio, Francine

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Low leakage, ultra-thin gate oxides for extremely high performance sub-100 nm nMOSFETs von Timp, G., Agarwal, A., Baumann, F.H., Boone, T., Buonanno, M., Cirelli, R., Donnelly, V., Foad, M., Grant, D., Green, M., Gossmann, H., Hillenius, S., Jackson, J., Jacobson, D., Kleiman, R., Komblit, A., Klemens, F., Lee, J.T.-C., Mansfield, W., Moccio, S., Murrell, A., O'Malley, M., Rosamilia, J., Sapjeta, J., Silverman, P., Sorsch, T., Tai, W.W., Tennant, D., Vuong, H., Weir, B.

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Progress toward 10 nm CMOS devices von Timp, G., Bourdelle, K.K., Bower, J.E., Baumann, F.H., Boone, T., Cirelli, R., Evans-Lutterodt, K., Garno, J., Ghetti, A., Gossmann, H., Green, M., Jacobson, D., Kim, Y., Kleiman, R., Klemens, F., Kornlit, A., Lochstampfor, C., Mansfield, W., Moccio, S., Muller, D.A., Ocola, I.E., O'Malley, M.I., Rosamilia, J., Sapjeta, J., Silverman, P., Sorsch, T., Tennant, D.M., Timp, W., Weir, B.E.

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An anode hole injection percolation model for oxide breakdown-the "doom's day" scenario revisited von Alam, M.A., Bude, J., Weir, B., Silverman, P., Ghetti, A., Monroe, D., Cheung, K.P., Moccio, S.

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Understanding the limits of ultrathin SiO sub(2) and Si-O-N gate dielectrics for sub-50 nm CMOS von Green, M L, Sorsch, T W, Timp, G L, Muller, D A, Weir, B E, Silverman, P J, Moccio, S V, Kim, Y O

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Book Review: Labor-Environment Coalitions: Lessons for a Louisiana Petrochemical Region. By Thomas Estabrook. Amityville, NY: Baywood Publishing Company, Inc.,2007. 232 pp. $49.95... von Walchuk, Bradley

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Book Review: Why Is There No Labor Party in the United States? By Robin Archer. Princeton, NJ: Princeton University Press, 2007. 368 pp. $35.00 hardcover von Bruno, Bob

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Book Review: Encyclopedia of U.S. Labor and Working-Class History. By Eric Arnesen. New York: Routledge, 2007. 2,064 pp. $565.00 hardback von Lancaster, Guy

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